Image Brightness Correction Method Based on Nanoparticle SEM Image Brightness Extraction

Abstract

The present invention is an image brightness correction method based on nanoparticle SEM image brightness extraction, which relates to general image data processing. The method is based on the overall brightness extraction of the nanoparticle SEM image and then corrects the uneven brightness in all areas of the image, especially When a certain boundary area in the nanoparticle SEM image has high brightness and another boundary area has a darker brightness, the average brightness of each pixel in the nanoparticle SEM image is displayed, and the nanoparticle SEM image is realized. The brightness is uniformized in all areas, which overcomes the problem that the existing technology cannot interpolate the boundary parts around the nanoparticle SEM image due to the high brightness and darker brightness often appearing at different peripheral boundaries of the image. Defects of uneven brightness in particle SEM images.

Description

technical field [0001] The technical solution of the present invention relates to general image data processing, specifically to an image brightness correction method based on nanoparticle SEM image brightness extraction. Background technique [0002] The electron beam in the scanning electron microscope (Scanning Electron Microscope, hereinafter referred to as SEM) is accelerated by voltage, converged by magnetic lens and scanned coil, and uses secondary electron signal imaging to observe the surface morphology of the sample, which has reached nanoscale Ultra-high resolution is widely used in the field of microscopic research in many disciplines of medicine, biology and materials. [0003] Due to the long-term work of the electron microscope, the filament shifts and swings, resulting in uneven reflection of the current, and the micro-tilt of the stage is not firm, resulting in inconsistent receiving and emitting currents of the sample. The currently acquired SEM images will...

AI Technical Summary

Problems solved by technology

[0005] The technical problem to be solved by the present invention is to provide an image brightness correction method based on nanoparticle SEM image brightness extraction, the method is based on the overall brightness extraction of nanoparticle SEM images and then corrects the uneven brightness of all regions of the image, especially It shows the average brightness of each pixel in the nanoparticle SEM image when a certain boundary area in the nanoparticle SEM image has high brightness, while the other boundary area has a darker brightness, and realizes the nanoparticle SEM image. The uniform brightness of the entire area of ​​the image overcomes the fact that the high brightness and dark brightness in the nanoparticle SEM image often appear in different peripheral boundaries of the image, and the existing technology cannot realize the interpolation of the surrounding boundary of the nanoparticle SEM image, resulting in the obtained Inhomogeneous Brightness Defects of SEM Images of Nanoparticles

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