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Integrated circuit and system

A technology of integrated circuits and functional modules, applied in the field of power electronics, can solve problems such as low efficiency and time-consuming monitoring

Active Publication Date: 2019-03-29
WUHAN HONGSHI TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] In view of this, the object of the present invention is to provide an integrated circuit and a system to alleviate the technical problems of offline monitoring of integrated circuits, time-consuming monitoring and low efficiency in existing monitoring means

Method used

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Embodiment 1

[0031] An embodiment of the present invention provides an integrated circuit, figure 2 A schematic structural diagram of an integrated circuit is shown, the integrated circuit includes a test processing device 20, and a plurality of functional modules 10 connected to the test processing device, wherein, for the convenience of description, figure 2 Only two functional modules are shown in the figure, and the number of the functional modules can be set according to actual usage during specific implementation, which is not limited in the embodiment of the present invention.

[0032] During specific implementation, the above-mentioned test processing device is used to receive the test vector, decode the test vector to extract the coded identifier carried in the test vector, and send a test command to the corresponding functional module according to the coded identifier; the functional module is used to receive The test command feeds back the current state information to the test...

Embodiment 2

[0068] On the basis of the above embodiments, an embodiment of the present invention further provides an integrated circuit system, the integrated circuit system includes an external terminal, and further includes the integrated circuit described in the above embodiments.

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Abstract

The invention provides an integrated circuit and a system, wherein the integrated circuit and the system relate to the field of power electronics technology. The integrated circuit comprises a testingprocessing device, and a plurality of functional modules which are connected with the testing processing device. The testing processing device performs decoding operation on a received testing vector, thereby extracting a code identification carried in the testing vector, and transmitting a testing command to the corresponding functional module according to the code identification. The functionalmodule is used for receiving the testing command and performs feedback of the current state information to the testing processing device according to the testing command. When a plurality of functional modules of the integrated circuit system perform a basic function, real-time monitoring can be performed on the self state according to the testing vector, and state information is fed back to an outer terminal. Real-time monitoring to the internal function of the integrated can be finished without connecting with a testing tool and suspending the working state of the integrated circuit system.The integrated circuit and the system have advantages of high convenience and high speed and furthermore save required monitoring time and workload.

Description

technical field [0001] The invention relates to the technical field of power electronics, in particular to an integrated circuit and a system. Background technique [0002] As a tiny electronic device, an integrated circuit uses a certain process to miniaturize a circuit composed of components such as semiconductor devices, capacitors, and resistors. Integrated circuits have the advantages of small size, long life, high reliability, and good performance. Therefore, they have been widely used in industrial and civilian electronic equipment such as mobile phones and computers. At the same time, they also have extensive applications in military, communication, and remote control. application. [0003] However, in order to ensure the quality and performance of the integrated circuit, it is necessary to monitor the function of the integrated circuit. The existing monitoring method is to use an external test tool to test the function of the integrated circuit. The main way is tha...

Claims

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Application Information

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IPC IPC(8): G01R31/28
CPCG01R31/2851
Inventor 高俊雄易开军托马斯·费尔兰德斯张贤斌
Owner WUHAN HONGSHI TECH