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Integrated Circuits and Systems

A technology of integrated circuits and functional modules, applied in the field of power electronics, can solve the problems of time-consuming monitoring and low efficiency, and achieve the effect of saving monitoring time and workload

Active Publication Date: 2021-12-14
WUHAN HONGSHI TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] In view of this, the object of the present invention is to provide an integrated circuit and a system to alleviate the technical problems of offline monitoring of integrated circuits, time-consuming monitoring and low efficiency in existing monitoring means

Method used

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  • Integrated Circuits and Systems
  • Integrated Circuits and Systems
  • Integrated Circuits and Systems

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Experimental program
Comparison scheme
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Embodiment 1

[0031] An embodiment of the present invention provides an integrated circuit, figure 2 A schematic structural diagram of an integrated circuit is shown, the integrated circuit includes a test processing device 20, and a plurality of functional modules 10 connected to the test processing device, wherein, for the convenience of description, figure 2 Only two functional modules are shown in the figure, and the number of the functional modules can be set according to actual usage during specific implementation, which is not limited in the embodiment of the present invention.

[0032] During specific implementation, the above-mentioned test processing device is used to receive the test vector, decode the test vector to extract the coded identifier carried in the test vector, and send a test command to the corresponding functional module according to the coded identifier; the functional module is used to receive The test command feeds back the current state information to the test...

Embodiment 2

[0068] On the basis of the above embodiments, an embodiment of the present invention further provides an integrated circuit system, the integrated circuit system includes an external terminal, and further includes the integrated circuit described in the above embodiments.

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Abstract

The invention provides an integrated circuit and a system, which relate to the technical field of power electronics, including a test processing device and a plurality of functional modules connected to the test processing device; the test processing device decodes received test vectors to extract test vectors The code identification carried in the code identification, and, according to the code identification, send a test command to the corresponding function module; the function module is used to receive the test command, and feed back the current state information to the test processing device according to the test command. The multiple function modules of the integrated circuit system are in While performing basic functions, it can monitor its own state in real time according to the test vector, and feed back the state information to the external terminal. It can complete the real-time monitoring of the internal function of the integrated circuit without external test tools and suspending the working state of the integrated circuit system. , has the advantage of being convenient and fast, and saves the required monitoring time and workload.

Description

technical field [0001] The invention relates to the technical field of power electronics, in particular to an integrated circuit and a system. Background technique [0002] As a tiny electronic device, an integrated circuit uses a certain process to miniaturize a circuit composed of components such as semiconductor devices, capacitors, and resistors. Integrated circuits have the advantages of small size, long life, high reliability, and good performance. Therefore, they have been widely used in industrial and civilian electronic equipment such as mobile phones and computers. At the same time, they also have extensive applications in military, communication, and remote control. application. [0003] However, in order to ensure the quality and performance of the integrated circuit, it is necessary to monitor the function of the integrated circuit. The existing monitoring method is to use an external test tool to test the function of the integrated circuit. The main way is tha...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/28
CPCG01R31/2851
Inventor 高俊雄易开军托马斯·费尔兰德斯张贤斌
Owner WUHAN HONGSHI TECH