A physical non-clonable structure and self-scrambling circuit structure based on interconnection lines
A technology for interconnecting wires and circuits, applied in the fields of microelectronics and integrated circuits, can solve the problems of increasing the processing and testing costs of designers, increasing the testing costs of designers, and inability to apply unclonable structures, and achieve the effect of enhancing uniqueness.
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Embodiment 1
[0047] Such as figure 1 As shown, the physical unclonable structure (iPUF) designed in the present invention is composed of a linear shift register, an interconnection network, a load buffer array, and a digital signature generator.
[0048] The linear shift register uses the input excitation signal as the initial value (seed) of the linear shift register, returns to its input terminal after summing the different digits in the linear shift register, so that the linear shift register is in the The value of each clock cycle changes, and the sequence generated by it has certain randomness; the λ bit in the linear shift register will be used as the excitation vector of the interconnect network.
[0049] The linear shift register is a general circuit structure. When different seeds are input to the linear shift register, it can generate different excitation vectors with a bit width of λ-2 in each clock cycle. λ is the number of interconnection wires in the interconnection wire ne...
Embodiment 2
[0054] In Example 1 ( figure 1 ) structure, interconnect manufacturing uncertainty is not a decisive factor for digital signatures. The magnitude of the crosstalk signal is also affected by factors such as signal rise delay, fall delay, leakage path charge and discharge, etc. Therefore, the crosstalk signal is difficult to predict or clone, so the physically unclonable structure can prevent modeling attacks. However, due to the shielding effect of the adjacent interconnection wires on the disturbed wire in the interconnection network, the crosstalk signal generated by the adjacent interconnection wires on the disturbed signal is much larger than the crosstalk generated by the attacking wire that is farther away from the disturbed wire signal size.
[0055] In order to make the manufacturing uncertainty of the interconnection wire become the main factor determining the digital signature, the structure of the interconnection wire network in the above-mentioned embodiment 1 is im...
Embodiment 3
[0057] In order to improve the uniqueness of the digital signature generated by the physical unclonable structure of the interconnection line, the present invention provides a physically unclonable structure based on the interconnection line and a self-scrambling circuit structure. On the basis of the unclonable structure, a self-scrambling circuit structure is further added, such as image 3 As shown, the self-scrambling circuit structure performs a bitwise sum operation on the digital signature generated by each chip, and the result of the sum operation is used as a mask to perform a cyclic XOR operation on the original digital signature. The self-scrambling circuit is composed of a counter-type mask generator, a non-volatile memory (an existing structure in the chip, used to store the mask generated by each chip), and a cyclic scrambling circuit.
[0058] Described counter-type mask generator, its input terminal is the output of the described physical unclonable structure (i...
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