Correction method and terminal equipment of pixel-level edge effect
An edge effect, pixel-level technology, applied in image enhancement, image analysis, image data processing, etc., can solve the problem of low accuracy of temperature measurement results, and improve the accuracy of heat reflection temperature measurement, high temperature error and low temperature error correction. Effect
Active Publication Date: 2021-03-23
THE 13TH RES INST OF CHINA ELECTRONICS TECH GRP CORP
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[0004] In view of this, the embodiment of the present invention provides a pixel-level edge effect correction method and a terminal device to solve the problem of low accuracy of the temperature measurement results of the device under test in the prior art
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[0040] In the following description, specific details such as specific system structures and technologies are presented for the purpose of illustration rather than limitation, so as to thoroughly understand the embodiments of the present invention. It will be apparent, however, to one skilled in the art that the invention may be practiced in other embodiments without these specific details. In other instances, detailed descriptions of well-known systems, devices, circuits, and methods are omitted so as not to obscure the description of the present invention with unnecessary detail.
[0041] In order to illustrate the technical solutions of the present invention, specific examples are used below to illustrate.
[0042] figure 1 It is a schematic flowchart of an implementation flow of a method for correcting pixel-level edge effects provided by an embodiment of the present invention, and is described in detail as follows.
[0043] Step 101, acquiring multiple images of a test ...
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The invention is applicable to the technical field of microelectronic device temperature detection, and provides a pixel-level edge effect correction method and terminal equipment, and the method comprises the steps: obtaining a plurality of images of a tested piece made of different materials; when the readings of the pixel points at the same positions on the preset line segments on different images are different;, controlling a nano displacement platform on the heat reflection imaging temperature measuring device to move in the direction opposite to the moving direction of the pixel points till pixel point readings at the same positions on the preset line segments on the different images are the same; therefore, the edge effect caused by the pixel-level position changes in the X direction and the Y direction can be corrected in an image processing mode, the high-temperature error and the low-temperature error caused by the position changes of the measured piece are corrected, and theheat reflection temperature measurement accuracy can be improved.
Description
technical field [0001] The invention belongs to the technical field of temperature detection of microelectronic devices, and in particular relates to a method for correcting pixel-level edge effects and terminal equipment. Background technique [0002] When visible light is irradiated on the surface of a certain material, the reflectivity of the material to visible light changes with the temperature of the material. There is a linear relationship between the change in the reflectivity of the material to visible light and the temperature change on the surface of the material, as shown in the formula Wherein, the ΔR is the amount of change in reflectivity; R average is the average value of reflectivity; ΔT is the temperature change of the measured material, the unit is K; C TR is the thermal reflectance calibration coefficient, unit is K -1 . It can be seen that C TR At different times, even if the same reflectance variation ΔR is measured, the calculated ΔT must be diff...
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IPC IPC(8): G06T7/00G01K11/00
CPCG01K11/006G06T7/0004G06T2207/30164
Inventor 梁法国郑世棋翟玉卫韩伟邹学锋乔玉娥李灏丁晨
Owner THE 13TH RES INST OF CHINA ELECTRONICS TECH GRP CORP