Storage system loss balancing method and device based on life prediction

Abstract

The invention discloses a storage system loss balancing method and device based on life prediction, and the method comprises the steps: carrying out the life prediction of each storage unit of a storage system, and obtaining the remaining use frequency of each storage unit through prediction; after the storage unit carries out one-time reading or writing operation, subtracting 1 from the remaininguse frequency of the storage unit; determining a maximum value and a minimum value in the remaining use times of each unit, and subtracting the minimum value from the maximum value to obtain a maximum difference value; if the maximum difference value of the remaining use times is greater than a preset loss balance threshold, copying the data in the storage unit corresponding to the maximum valueof the remaining use times to the storage unit corresponding to the minimum value of the remaining use times; and erasing the data in the storage unit corresponding to the maximum value of the numberof remaining use times, and using the storage unit corresponding to the maximum value of the number of remaining use times for hot data storage to perform loss equalization on the storage system. Theavailable state of the storage unit is truly reflected, the later utilization rate of the storage unit is increased, and the service life of the storage system is prolonged.

Description

technical field [0001] The present invention relates to the field of computer technology, and more specifically, to a storage system loss leveling method and device based on lifetime prediction. Background technique [0002] In the development of computer technology, storage devices have always been a very important component as a carrier for storing data. At present, solid-state storage devices using flash memory as storage media are widely used in consumer electronics, data centers, and military industries due to their advantages such as faster read and write speeds and better shock resistance. [0003] During the use of the memory chip, the medium of its storage unit will have defects as the number of programming / erasing cycles of the memory chip increases and eventually lead to failure of the storage unit. If the memory chip generates an uncorrectable error during operation, it will affect the entire Normal use of the storage system. The overall performance of the stor...

AI Technical Summary

Problems solved by technology

[0005] Aiming at the defects of the existing technology, the purpose of the present invention is to solve the technical problem that the utilization rate of the storage unit in the later period is very low due to the large difference in the maximum usage times of different storage units in the existing wear leveling technology.

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