Substrate residual material detection method and substrate residual material detection device
A detection device and substrate technology, which can be used in glass cutting devices, optical device exploration, manufacturing tools, etc., and can solve problems such as production capacity loss
Active Publication Date: 2022-04-26
SHENZHEN CHINA STAR OPTOELECTRONICS SEMICON DISPLAY TECH CO LTD
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Problems solved by technology
The actual torque value C when the residual material clamp is clamping will gradually exceed the range value of A, causing the equipment to trigger an alarm by mistake and resulting in loss of production capacity
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[0028] In order to make the above and other objectives, features, and advantages of the present disclosure more comprehensible, preferred embodiments of the present disclosure will be exemplified below in detail with reference to the attached drawings.
[0029] In the figures, structurally similar units are denoted by the same reference numerals.
[0030] like figure 1 and figure 2 As shown, the present disclosure provides a substrate residue detection method, which includes the following steps:
[0031] S1: install the sensor 120 on the cutting part 110 of the substrate cutting device 100 on the substrate cutting device 100;
[0032] S2: setting substrate residue detection software in the substrate cutting device 100;
[0033] S3: using the cutting part 110 to separate the substrate 210 from the substrate 200; and
[0034] S4: using the cutting part 110 to cut the substrate residue 220 generated in the substrate separation step;
[0035] Wherein, the sensor 120 is used ...
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The disclosure provides a substrate residual material detection method and a substrate residual material detection device. The substrate residual material detection method includes the following steps: installing a sensor on the substrate cutting device in the cutting part of the substrate cutting device, setting the substrate residual material detection software in the substrate cutting device, and using the cutting part to automatically cut the substrate The substrate is separated from the glass, and the substrate residue generated in the substrate separation step is cut by the cutting unit. Wherein, the sensor is used to detect whether the residual material of the substrate has fallen, and an alarm is activated when the falling state is abnormal through the residual material detection software of the substrate, which can more accurately determine whether the residual material of the substrate is abnormal , so as to prevent abnormal substrate cutting quality in advance to improve yield.
Description
【Technical field】 [0001] The disclosure relates to a detection method and a detection device, in particular to a substrate residual material detection method and a substrate residual material detection device. 【Background technique】 [0002] In the production process of glass substrates used in liquid crystal displays in the prior art, the cutting part of the substrate cutting device is responsible for separating the substrate from the substrate glass and discarding excess substrate residues. [0003] However, when the knife pressure of the cutting part is not set properly, the residual material of the substrate may fall or not fall in advance, both of which will lead to poor cutting process of the substrate glass. [0004] The method used in the current production line to monitor whether the residual material of the substrate falls in advance is to judge whether the residual material of the substrate falls in advance by monitoring the torque value of the motor of the residu...
Claims
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IPC IPC(8): C03B33/023G01V8/10
CPCC03B33/023G01V8/10Y02P40/57
Inventor 李世龙
Owner SHENZHEN CHINA STAR OPTOELECTRONICS SEMICON DISPLAY TECH CO LTD