Chip testing method and device, electronic equipment and computer readable medium

Abstract

The invention relates to a chip testing method and a device, electronic equipment and a computer readable medium. The method relates to the field of chip testing, and comprises the steps of determining language rules of a to-be-tested chip; determining a product and a time sequence specification of a chip to be tested; determining a to-be-tested template from a test template library according to the language rule and the product and time sequence specification; generating a test code according to the product and time sequence rule and the to-be-tested template; and automatically testing the to-be-tested chip through the test code. According to the chip testing method and the device, the electronic equipment and the computer readable medium, big data complex memory testing codes can be automatically generated, DDR4 memory testing codes of different specifications are rapidly generated in a normalization mode, and the chip product verification and analysis efficiency is improved.

Description

technical field [0001] The present disclosure relates to the field of chip testing, in particular, to a chip testing method, device, electronic equipment and computer readable medium. Background technique [0002] With the rapid development of current storage technology and the rapid expansion of the storage market, memory chips are rapidly rising due to their absolute advantages such as large capacity, fast read and write speed, and low price. Various high-speed and detailed tests are required. [0003] In the related art, most of the work of testing memory products needs to be done manually by testers. The testers need to confirm the corresponding model and speed of the memory to be tested, and then select the test items suitable for the memory model. After determining the test item, the tester also needs to manually write the test code. For each test instruction, the code must be written in sequence, and then the memory test is performed by writing the completed code. ...

AI Technical Summary

Problems solved by technology

[0004] This method of chip testing by manually writing codes greatly wastes manpower and material resources and reduces the efficiency of memory testing.

Moreover, with the development of the times, more and more fast and large-capacity memories come out, and the demand for the complexity and number of codes of memory test codes is also getting higher and higher. For big data test codes, continue to pass manual The way of writing line-by-line generation codes has also restricted the development of the memory test industry

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