Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Optical Image and Laser Altimeter Data Adjustment Method Based on Rational Function Model

A technology of optical image and rational function, which is applied in the direction of measuring distance, measuring device, line-of-sight measurement, etc., and can solve problems such as inapplicability, unstable adjustment accuracy, and ill-conditioned normal equations

Active Publication Date: 2021-05-11
TONGJI UNIV
View PDF7 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] However, when only laser altimetry is used as the elevation constraint to add the adjustment model, the entire regional network to be adjusted lacks plane control, and the degree of freedom of the regional network is relatively high. Directly solving the parameters to be adjusted as free unknowns will lead to the normal equation The ill condition of the adjustment leads to instability of the adjustment accuracy, and in the adjustment, the coefficient matrix of the image square correction parameter contains error items, which is not suitable for the G-M model (Gauss-Markov model), which is the most basic measurement adjustment. mathematical model of

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Optical Image and Laser Altimeter Data Adjustment Method Based on Rational Function Model
  • Optical Image and Laser Altimeter Data Adjustment Method Based on Rational Function Model
  • Optical Image and Laser Altimeter Data Adjustment Method Based on Rational Function Model

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0047] like figure 1 As shown, the present embodiment proposes a method for adjusting optical images and laser altimetry data based on a rational function model, and the method includes the following steps:

[0048] S1: Obtain corresponding optical image data and laser altimetry data;

[0049] S2: Establish a rational function model of optical image data and laser altimetry data;

[0050] S3: According to the rational function model, construct a deviation compensation model including parameters to be sought, and establish a joint adjustment model of optical images and laser altimetry data, the joint adjustment model includes error equations of virtual control points, and the virtual control points is the corresponding point of optical image and laser altimetry data;

[0051] S4: Solve the joint adjustment model by using the total least squares method based on the partial-EIV model, and obtain the parameters to be requested of the deviation compensation model;

[0052] S5: O...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to a method for adjusting optical image and laser altimetry data based on a rational function model. The method includes the following steps: S1: Acquire corresponding optical image data and laser altimetry data; S2: Establish optical image data and laser altimetry data Rational function model of altimetry data; S3: According to the rational function model, build a deviation compensation model including the parameters to be obtained, and establish a joint adjustment model of optical imagery and laser altimetry data. The joint adjustment model includes virtual control points Error equation, the virtual control point is the corresponding point of the optical image and laser altimetry data; S4: Solve the joint adjustment model using the total least squares method based on the partial-EIV model, and obtain the parameters to be requested of the deviation compensation model; S5: According to the deviation compensation model, the elevation positioning result of the image is obtained. Compared with the prior art, the present invention has the advantages of high adjustment accuracy, effectively improving the elevation positioning accuracy of images, and the like.

Description

technical field [0001] The invention relates to the technical field of laser height measurement, in particular to an optical image and laser height measurement data adjustment method based on a rational function model. Background technique [0002] Rational function model (RFM) is a generalized imaging model independent of photography platforms and sensors. It is generated by a strict imaging model. It is actually a numerical approximation to the strict imaging model. Although there is no strict imaging model in theory Strict, but the positioning accuracy in actual production can reach the accuracy of the strict imaging model. The error of the strict imaging model also exists in the RFM, and the RFM can be compensated for the deviation through the image square correction parameters. In traditional photogrammetry, it is necessary to add ground control points to generate a digital elevation model (Digital Elevation Model, DEM) by aerial triangulation. For large-scale area ne...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01C3/00
CPCG01C3/00
Inventor 刘世杰龙杭高晓峰童小华金雁敏谢欢李荣兴陈鹏许雄柳思聪冯永玖王超魏超
Owner TONGJI UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products