A channel consistency calibration method for a dual-channel instrument

Abstract

The invention discloses a method for channel consistency calibration of a dual-channel instrument, comprising the following steps: S1. Given a step pulse signal source A and a step pulse signal source B used in a test, use an oscilloscope to measure the step pulse signal source A Perform parameter testing with step pulse signal source B; S2. In the first connection mode, calculate the gain and consistency baseline parameters of signal receiving channels A and B, and perform consistency calibration on signal receiving channels A and B; S3. In the second connection mode, the gain and consistency baseline parameters of signal receiving channels A and B are calculated as factory calibration parameters; S4. When using a dual-channel instrument for signal measurement, the signal receiving channel A and The signal received by channel B is used for calibration. The invention can debug and calibrate the gain, offset and dual-channel consistency of the dual-channel instrument, and perform dual-channel consistency processing on the measured data during actual testing to ensure the consistency of the dual-channel data.

Description

technical field [0001] The invention relates to the calibration of electronic measuring instruments, in particular to a channel consistency calibration method for a dual-channel instrument. Background technique [0002] Many dual-channel instruments or test systems have the problem of inconsistency between the two channels, such as spectrum analyzers with I and Q two-channel data acquisition, ATC / DME aviation with integrated radio transceiver technology and capable of signal generation and reception Electronic comprehensive tester, sampling oscilloscope / time domain reflection analyzer capable of generating pulse signals and receiving reflected signals, and other test systems with dual-channel signal generation and reception, etc. These instruments or test systems are complex because the circuits involved in the signal generation and acquisition channels, the hardware consistency is poor, and debugging is difficult. For debugging and calibration, it is necessary to cooperate...

AI Technical Summary

Problems solved by technology

These instruments or test systems are complex because the circuits involved in the signal generation and acquisition channels, the hardware consistency is poor, and debugging is difficult. Debugging and calibration, need to cooperate with software and algorithm debugging and calibration dual-channel consistency

In some applications, the signal generation and acquisition consistency of the two channels is required to be very high, and some instruments still have the phenomenon that the signal generation and reception data of the two channels are inconsistent after leaving the factory, resulting in large measurement errors.

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