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Uniformity calculation method, device, controller and storage medium

A computing method and computing device technology, which are applied in the manufacturing of semiconductor devices, electric solid-state devices, and semiconductor/solid-state devices, etc., can solve the problem of inability to specifically quantify the uniformity of light emission of the target display panel, and the inability to debug and analyze the uniformity of inkjet printing and film formation. OLED device performance provides data reference and other issues

Active Publication Date: 2022-05-31
SHENZHEN CHINA STAR OPTOELECTRONICS SEMICON DISPLAY TECH CO LTD
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0005] Embodiments of the present invention provide a uniformity calculation method, device, controller, and storage medium. For a standard display panel formed by vapor deposition and a target display panel formed by inkjet, when the luminance values ​​of the two are the same, the standard display panel The first parameter information of the light-emitting area in the panel and the second parameter information of the light-emitting area in the target display panel, so as to obtain the uniformity of light emission of the target display panel relative to the standard display panel; to solve the problem that it is currently impossible to specifically quantify the light emission of the target display panel Uniformity, resulting in the inability to provide data reference for inkjet printing film uniformity debugging and analysis of OLED device performance

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  • Uniformity calculation method, device, controller and storage medium

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Embodiment Construction

[0044] The terms "first", "second" and the like in the present invention are used to distinguish different objects, rather than to describe a specific order.

[0046] The execution body of the image display method provided by the embodiment of the present invention may be the image provided by the embodiment of the present invention

[0047] The embodiments of the present invention provide a uniformity calculation method, a uniformity calculation device, a controller and a storage medium. the following

[0049] It can be understood that the light-emitting principle of the OLED display panel is to use vacuum evaporation on the anode layer on the substrate or

[0052] In one embodiment, as shown in FIG. 1, the method may include the following steps.

[0053] S10, obtain the brightness value of the standard display panel.

[0056] In an embodiment, before the step S10, the following steps may be included.

[0058] Specifically, the corresponding anode voltage of each sub-pixel in eac...

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Abstract

The invention provides a uniformity calculation method, device, controller and storage medium, which are used to obtain the luminous uniformity of the target display panel relative to the standard display panel. The difference between the standard display panel and the target panel is: the pixels of the standard display panel are evaporated Formed by plating, the pixels of the target display panel are formed by inkjet, the method includes: obtaining the brightness value of the standard display panel; adjusting the target display panel according to the brightness value of the standard display panel until the brightness value of the target display panel is the same The luminance values ​​are the same; obtain the first parameter information of the light-emitting area in the standard display panel and the second parameter information of the light-emitting area in the target display panel; according to the first parameter information and the second parameter information, obtain the target display panel relative to the standard The uniformity of light emission of the display panel. This solution can quantify the luminous uniformity of the target display panel, and provide data reference for debugging the uniformity of inkjet printing film formation and analyzing the performance of OLED devices.

Description

Uniformity calculation method, device, controller and storage medium technical field [0001] The present invention relates to the field of display technology, and in particular, to a uniformity calculation method, device, controller and storage medium. Background technique [0002] At present, the use of inkjet printing technology to make OLED devices has the advantages of low environmental requirements and high material utilization. A feasible way to reduce the production cost of OLED devices. The stability of ink in inkjet printing technology, the consistency of inkjet time, the degree of volatilization of ink in different regions, etc. factors, which will eventually affect the chromaticity, efficiency, and lifespan of OLED devices. And analyze the performance of OLED devices to improve the above problems. However, there is currently a lack of specific homogeneity calculation methods to produce quantitative The value of , provides a data reference for debugging the...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01L51/56H01L21/66
CPCH10K71/135H10K71/70
Inventor 李少方
Owner SHENZHEN CHINA STAR OPTOELECTRONICS SEMICON DISPLAY TECH CO LTD