Integrated circuit test method and system

A technology of integrated circuits and test methods, applied in the direction of electronic circuit testing, measuring electricity, measuring devices, etc., can solve problems such as inability to meet

Active Publication Date: 2020-10-09
HANGZHOU XINXUN TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

Obviously, the traditional solidified test configuration can no longer meet the above requirements

Method used

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  • Integrated circuit test method and system
  • Integrated circuit test method and system

Examples

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Embodiment Construction

[0118] Various embodiments of the invention will be described in more detail below with reference to the accompanying drawings. In the various drawings, the same elements are denoted by the same or similar reference numerals. For the sake of clarity, various parts in the drawings have not been drawn to scale.

[0119] The specific implementation manners of the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments.

[0120] figure 2 A schematic structural diagram of an integrated circuit testing system according to a second embodiment of the prior art is shown. Such as figure 2 As shown, the integrated circuit test system includes: a stimulus unit 210 , a DUT 220 , an analysis unit 230 and an evaluation unit 240 . Test DUT220 with test configuration to obtain test data. Wherein, the test configuration specifies at least one test item, and a test stimulus and a test specification corresponding to the at l...

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PUM

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Abstract

The invention discloses an integrated circuit test method and system. The test method comprises the following steps: testing a plurality of integrated circuits by adopting test configuration to obtaintest data; and obtaining test results of the plurality of integrated circuits according to the test data, in the test step, the test configuration is changed in real time according to change conditions related to the test data, and the test configuration specifies at least one test item and test excitation and test specifications corresponding to the at least one test item. A large amount of real-time test data is analyzed; according to the test configuration and the change conditions of the test configuration, on the basis of maintaining the basic test configuration, part of test items or test incentives or test specifications are changed in real time, and multiple test schemes can be implemented without upgrading the test configuration through a change process, so that more efficient test behaviors are supported, and the purpose of intelligent test is achieved.

Description

technical field [0001] The invention relates to the technical field of integrated circuit testing, in particular to an integrated circuit testing method and system. Background technique [0002] After the integrated circuit (Integrated Circuit, IC) is manufactured, it is necessary to perform a performance test on the integrated circuit, so as to screen out the integrated circuit that does not meet the design requirements, and further classify the qualified integrated circuit according to various performance tests. [0003] figure 1 A schematic flow chart of an integrated circuit testing method according to the first embodiment of the prior art is shown. like figure 1 As shown, the test stimulus Xi is first input to the DUT (integrated circuit under test) 110, and then in the analysis unit 120, the output response (i.e. test data) Yi is compared with the expected response (i.e. test specification) Ci to determine whether the DUT110 satisfies Design requirements, and classi...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/28
CPCG01R31/2894Y02P90/30
Inventor 宋卫权张健
Owner HANGZHOU XINXUN TECH CO LTD
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