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Integrated circuit test method and system

A technology of integrated circuits and testing methods, applied in the direction of electronic circuit testing, measuring electricity, measuring devices, etc., can solve problems such as inability to meet, and achieve the effect of efficient testing behavior

Active Publication Date: 2021-10-15
HANGZHOU XINXUN TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Obviously, the traditional solidified test configuration can no longer meet the above requirements

Method used

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  • Integrated circuit test method and system
  • Integrated circuit test method and system
  • Integrated circuit test method and system

Examples

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Embodiment Construction

[0118] Various embodiments of the invention will be described in more detail below with reference to the accompanying drawings. In the various drawings, the same elements are denoted by the same or similar reference numerals. For the sake of clarity, various parts in the drawings have not been drawn to scale.

[0119] The specific implementation manners of the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments.

[0120] figure 2 A schematic structural diagram of an integrated circuit testing system according to a second embodiment of the prior art is shown. Such as figure 2 As shown, the integrated circuit test system includes: a stimulus unit 210 , a DUT 220 , an analysis unit 230 and an evaluation unit 240 . Test DUT220 with test configuration to obtain test data. Wherein, the test configuration specifies at least one test item, and a test stimulus and a test specification corresponding to the at l...

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PUM

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Abstract

The application discloses an integrated circuit testing method and system. The testing method includes: testing a plurality of integrated circuits using a test configuration to obtain test data; and obtaining test results of a plurality of integrated circuits according to the test data, wherein, in the testing step, changing the test configuration in real time according to changing conditions related to the test data , the test configuration specifies at least one test item, and a test stimulus and a test specification corresponding to the at least one test item. Through the analysis of a large amount of real-time test data, according to the test configuration and the change conditions of the test configuration, on the basis of retaining the basic test configuration, real-time changes to some test items or test incentives or test specifications can be implemented without upgrading the test configuration through the change process A variety of test schemes support more efficient test behavior and achieve the purpose of intelligent testing.

Description

technical field [0001] The invention relates to the technical field of integrated circuit testing, in particular to an integrated circuit testing method and system. Background technique [0002] After the integrated circuit (Integrated Circuit, IC) is manufactured, it is necessary to perform a performance test on the integrated circuit, so as to screen out the integrated circuit that does not meet the design requirements, and further classify the qualified integrated circuit according to various performance tests. [0003] figure 1 A schematic flow chart of an integrated circuit testing method according to the first embodiment of the prior art is shown. Such as figure 1 As shown, the test stimulus Xi is first input to the DUT (integrated circuit under test) 110, and then in the analysis unit 120, the output response (i.e. test data) Yi is compared with the expected response (i.e. test specification) Ci to determine whether the DUT110 satisfies Design requirements, and cla...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/28
CPCG01R31/2894Y02P90/30
Inventor 宋卫权张健
Owner HANGZHOU XINXUN TECH CO LTD
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