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Method, device and system for measuring backlight partition size

A technology of backlight partitions and measurement methods, which is applied in the direction of measuring devices, optical devices, instruments, etc., and can solve the problem that the size parameters of the backlight partitions of the display unit cannot be obtained, etc.

Active Publication Date: 2020-12-11
深圳市TCL高新技术开发有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] The embodiment of the present application provides a method, device and system for measuring the size of the backlight partition, which can solve the problem in the related art that the size parameters of the backlight partition of the display unit cannot be obtained

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  • Method, device and system for measuring backlight partition size
  • Method, device and system for measuring backlight partition size
  • Method, device and system for measuring backlight partition size

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Embodiment Construction

[0032] In the following description, specific details such as specific system structures and technologies are presented for the purpose of illustration rather than limitation, so as to thoroughly understand the embodiments of the present application. It will be apparent, however, to one skilled in the art that the present application may be practiced in other embodiments without these specific details. In other instances, detailed descriptions of well-known systems, devices, circuits, and methods are omitted so as not to obscure the description of the present application with unnecessary detail.

[0033] It should be understood that when used in this specification and the appended claims, the term "comprising" indicates the presence of described features, integers, steps, operations, elements and / or components, but does not exclude one or more other Presence or addition of features, wholes, steps, operations, elements, components and / or collections thereof.

[0034] It should...

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Abstract

This application is applicable to the field of display unit technology, and provides a method, device and system for measuring the size of backlight partitions. The measurement method includes: controlling the display of the display unit based on the display parameters of several preset test patterns and obtaining the black stripes of the displayed image Brightness value, the preset test pattern includes black and white stripes, and the offset values ​​of the preset test patterns are not equal; determined according to the black stripe brightness value and the offset value corresponding to the preset test patterns The size parameter of the backlight partition corresponding to the display unit. The present application can solve the problem in the related art that the size parameters of the backlight partition corresponding to the display unit cannot be obtained.

Description

technical field [0001] The present application belongs to the technical field of displays, and in particular relates to a method, device and system for measuring the size of backlight partitions. Background technique [0002] With the continuous development of light emitting diode (Light Emitting Diode, LED) technology, the LED backlight unit has become a mainstream product of the backlight source in the display unit. [0003] Among the LED backlight display units, the dynamic backlight display unit with LED partitions has gradually become a research and development hotspot because of its better dynamic contrast and layering. The smaller the backlight partition, the more precise the control of the backlight and the better the display effect. However, smaller partition sizes lead to a significant increase in the cost of the backlight. [0004] For example, compared with the traditional LED backlight unit, the Mini-LED backlight unit will adopt a more dense chip arrangement ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01B11/00
CPCG01B11/00
Inventor 闫晓林林智远谢相伟
Owner 深圳市TCL高新技术开发有限公司