Waveguide type two-dimensional material photothermal effect measuring device

A technology of two-dimensional materials and photothermal effect, which is applied in the directions of measurement devices, color/spectral characteristic measurement, and material analysis, etc., can solve the problems of complex photothermal effect devices of two-dimensional materials, and achieve simple structure, high detection sensitivity and small size Effect

Inactive Publication Date: 2020-12-01
西安柯莱特信息科技有限公司
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  • Application Information

AI Technical Summary

Problems solved by technology

In the laboratory, the device for measuring the photothermal effect of two-dimensional materials is complex

Method used

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  • Waveguide type two-dimensional material photothermal effect measuring device
  • Waveguide type two-dimensional material photothermal effect measuring device
  • Waveguide type two-dimensional material photothermal effect measuring device

Examples

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Embodiment 1

[0021] The present invention provides a waveguide-type two-dimensional material photothermal effect measurement device, including: a light source, a photodetector, a substrate, and a first rectangular noble metal part 1 placed on the substrate, a second rectangular noble metal part 2, a two-dimensional material 5, Sensitive media6. The material of the substrate is silicon. like figure 1 As shown, the first rectangular noble metal part 1 and the second rectangular noble metal part 2 are parallel and form a metal-dielectric-metal waveguide, and the metal-dielectric-metal waveguide includes a waveguide input end 3 and a waveguide output end 4 . The material of the first rectangular noble metal part 1 and the second rectangular noble metal part 2 is noble metal. Preferably, the material of the first rectangular noble metal part 1 and the second rectangular noble metal part 2 is gold, gold has good surface plasmon properties, and the gold material is also corrosion-resistant. Th...

Embodiment 2

[0025] On the basis of Example 1, such as figure 2 As shown, a two-dimensional material 5 is also attached on the other side of the metal-dielectric-metal waveguide, and a sensitive medium 6 is placed between the two two-dimensional materials 5 . That is to say, the two-dimensional material 5 is attached on the opposite side walls of the metal-dielectric-metal waveguide, and the sensitive medium 6 is arranged between the two-dimensional materials 5 . In this way, the two-dimensional material 5 can generate more heat, so that the temperature of the sensitive medium 6 can be raised more, thereby improving the sensitivity of photothermal effect detection.

Embodiment 3

[0027] On the basis of Example 2, such as image 3 As shown, the first heat insulating material part 7 and the second heat insulating material part 8 are included, and the first heat insulating material part 7 and the second heat insulating material part 8 are recessed on the surfaces of the first rectangular noble metal part 1 and the second rectangular noble metal part 2 respectively. That is, if image 3 As shown, the sides of the first heat insulating material part 7 are flush with the sides of the first rectangular noble metal part 1 , and the sides of the second heat insulating material part 8 are flush with the sides of the second rectangular noble metal part 2 . A two-dimensional material 5 or a sensitive medium 6 is attached to the side surfaces of the first heat insulating material part 7 and the second heat insulating material part 8 . The first insulating material 7 and the second insulating material 8 are poor conductors of heat. Preferably, the material of the ...

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Abstract

The invention relates to the field of two-dimensional material photothermal characteristic detection, and particularly provides a waveguide type two-dimensional material photothermal effect measuringdevice. A two-dimensional material is arranged in a metal-medium-metal waveguide; a sensitive medium is arranged between the two-dimensional material and the other side surface of the metal-medium-metal waveguide; under the action of light, the two-dimensional material generates heat, the temperature of the sensitive medium rises after the sensitive medium absorbs the heat, and the refractive index of the sensitive medium is changed, so that the resonance wavelength of the sensitive medium is changed, the transmission characteristic of the waveguide is changed, and the photo-thermal characteristic of the two-dimensional material is determined according to the relationship between the position of a resonance peak in a transmission spectrum and incident light intensity. The resonance wavelength of the sensitive medium is very sensitive to the refractive index, so that the device has the advantage of high detection sensitivity. In addition, the two-dimensional material is arranged in thewaveguide, and the device is simple in structure and small in size.

Description

technical field [0001] The invention relates to the field of photothermal characteristic detection of two-dimensional materials, in particular to a waveguide type two-dimensional material photothermal effect measurement device. Background technique [0002] The photothermal effect refers to the phenomenon that a material generates heat when it is irradiated by light. Two-dimensional materials such as graphene, transition metal sulfides, and black phosphorus have unique optoelectronic properties and have attracted extensive attention. The photothermal effect of these materials makes them have good application prospects in biological imaging and biological detection. Therefore, it is very important to measure the photothermal effect of these materials. There is currently no mature commercial measurement equipment. In the laboratory, the device for measuring the photothermal effect of two-dimensional materials is complex. Contents of the invention [0003] In order to sol...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/17G01N21/25
CPCG01N21/171G01N21/25
Inventor 不公告发明人
Owner 西安柯莱特信息科技有限公司
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