Check patentability & draft patents in minutes with Patsnap Eureka AI!

General test system suitable for microwave radar

A general-purpose test and microwave radar technology, which is applied in radio wave measurement systems, instruments, electrical digital data processing, etc., to achieve the effect of reducing the research and development cycle and research and development costs

Pending Publication Date: 2021-03-23
SPACE STAR TECH CO LTD
View PDF0 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The technical problem solved by this application is: in view of the high R&D period and R&D cost of the radar general automatic test system in the prior art, this application provides a general test system suitable for microwave radar, provided in the embodiment of this application Among the solutions, in the solution provided by the embodiment of this application, in the first aspect, the compatibility between different types of test information can be realized by packaging the test information into a standard test file; in the second aspect, the packaged standard test file automatically The test software is reconfigured without manually adjusting the test software configuration, which reduces the research and development cycle and research and development costs of the radar general automated test system; in the third aspect, the hardware subsystem adjusts the hardware subsystem connected to the tested radar product according to the test information. Interface adapter, and according to the adjusted interface adapter is connected with the radar product under test, no need to re-develop the interface adapter in the new radar general automated test system according to the test information, reducing the development period and development cost of the radar general automated test system

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • General test system suitable for microwave radar
  • General test system suitable for microwave radar
  • General test system suitable for microwave radar

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0034] In order to better understand the above technical solutions, the technical solutions of the present application will be described in detail below through the accompanying drawings and specific examples. It should be understood that the embodiments of the present application and the specific features in the examples are detailed descriptions of the technical solutions of the present application, and It is not a limitation to the technical solutions of the present application, and the embodiments of the present application and the technical features in the embodiments can be combined without conflict.

[0035] see figure 1 , the embodiment of the present application provides a general test system suitable for microwave radar, the system includes: test equipment 1 and hardware subsystem 2; wherein,

[0036] The test device 1 is used to receive test information input by an operator, and package the test information into a standard test file, reconfigure the preset test soft...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a general test system suitable for a microwave radar. The system comprises test equipment and a hardware subsystem. The test equipment is used for receiving test information inputted by an operator, packaging the test information into a standard test file, reconfiguring preset test software according to the standard test file, executing the reconfigured test software and outputting the test information, wherein the test information comprises test demand information and test interface information of the tested radar product, and a description language of the test file isa preset standard description language; and the hardware subsystem is used for receiving the test information outputted by the test equipment, acquiring the tested parameters from the tested radar product according to the test information, adjusting the interface adapter connected with the tested radar product, and connecting with the tested radar product according to the adjusted interface adapter. According to the invention, the technical problems of relatively high research and development period and relatively high research and development cost of the radar general automatic test system in the prior art are solved.

Description

technical field [0001] This application relates to the technical field of radar test system design, in particular to a general test system suitable for microwave radar. Background technique [0002] With the explosive growth of the number and types of microwave radar models developed in the civilian and military markets, the types of microwave radar products are diversified. In order to ensure the performance of different microwave radar products, it is necessary to perform performance tests on microwave radar products. The performance of microwave radar products Testing is an important link in the design process of microwave radar products. [0003] At present, the radar general automatic test system is often used to comprehensively test the function and performance of multi-type radar systems. In order to realize the comprehensive test of multi-type radar system functions and performance, replaceable interface adapter technology is used to complete the hardware design of t...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G01S7/40G06F13/38
CPCG01S7/40G06F13/382
Inventor 刘乃强丁庆海张少甫赵毅寰戴宗武
Owner SPACE STAR TECH CO LTD
Features
  • R&D
  • Intellectual Property
  • Life Sciences
  • Materials
  • Tech Scout
Why Patsnap Eureka
  • Unparalleled Data Quality
  • Higher Quality Content
  • 60% Fewer Hallucinations
Social media
Patsnap Eureka Blog
Learn More