Structure and method for random code generation

Abstract

The invention relates to a structure and a method for random code generation. Disclosed is a structure for implementing a Physically Unclonable Function (PUF)-based random number generator and a method for forming the structure. The structure includes same-type, same-design devices in a semiconductor layer. While values of a performance parameter exhibited by some devices (i.e., first devices) are within a range established based on the design, values of the same performance parameter exhibited by other devices (i.e., second devices) is outside that range. A random distribution of the first and second devices is achieved by including randomly patterned dopant implant regions in the semiconductor layer. Each first device is separated from the dopant implant regions such that its performance parameter value is within the range and each second device has a junction with dopant implant region(s) such that its performance parameter value is outside the range or vice versa. A random number generator can be operably connected to the devices to generate a PUF-based random number.

Description

technical field [0001] The present invention relates to the generation of random numbers (eg, random codes or keys), and more particularly, to a structure for implementing a Physically Unclonable Function (PUF) based random number generator and a method for forming the structure. Background technique [0002] As Internet of Things (IoT) objects become more widely used, wireless communications and data are becoming more vulnerable to a variety of security threats that previously used software-based technologies are no longer sufficient to deal with such security threats. More recently, physical unclonable function (PUF) based random number generators have been developed to provide random keys (ie, random codes) for cryptographic techniques (eg, encryption and decryption), advanced authentication, and the like. PUF-based random number generators are not implemented in software, but in hardware hidden on the chip. Specifically, a PUF-based random number generator is an on-chi...

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Problems solved by technology

However, manufacturing flows are typically designed to minimize process variation, and if / when naturally occurring process variations result in a small range of performance variation across the array, and additionally, if / when this range may depend on operating conditions (e.g., It is difficult to ensure that the same random binary number is generated repeatedly and consistently with varying temperatures and / or varying operating voltages)

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