Test question generation method and device

A technology for generating test questions and information, applied in the field of information processing, can solve problems such as inability to effectively prevent students from cheating, inability to fully test students' understanding and mastery of knowledge points, etc., so as to prevent cheating and ensure fairness.

Pending Publication Date: 2021-05-14
LENOVO (BEIJING) CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The embodiment of the present disclosure provides a method and device for generating test questions, which can solve the problems in the prio

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  • Test question generation method and device

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Embodiment Construction

[0048] Various aspects and features of the present disclosure are described herein with reference to the accompanying drawings.

[0049] It should be understood that various modifications may be made to the embodiments applied for herein. Accordingly, the above description should not be viewed as limiting, but only as exemplifications of embodiments. Those skilled in the art will envision other modifications within the scope and spirit of the disclosure.

[0050] The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments of the disclosure and, together with the general description of the disclosure given above and the detailed description of the embodiments given below, serve to explain the embodiments of the disclosure. principle.

[0051] These and other characteristics of the present disclosure will become apparent from the following description of preferred forms of embodiment given as non-limiting examples wi...

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PUM

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Abstract

The invention relates to a test question generation method and device, and the method comprises the steps: carrying out the first natural language processing on question information of a first test question, and determining the examination knowledge points in the first test question; performing second natural language processing on question stem information of the first test question to obtain entity information of the first test question, wherein the entity information is a core word contained in the first test question; and generating at least one second test question based on the knowledge points and the entity information, the second test question being the same as the first test question in question type. According to the method and the device, different question stem descriptions can be generated under the condition that the examined knowledge points are inconvenient, so that the understanding and mastering capabilities of students on the knowledge points are fully examined; and meanwhile, different question stem descriptions are adopted for different test questions, so that cheating behaviors in the test can be effectively prevented, and the fairness and justice of the test score can be ensured to a greater extent.

Description

technical field [0001] The present disclosure relates to the technical field of information processing, and in particular to a method and device for generating test questions. Background technique [0002] In the prior art, in order to prevent students from cheating in the exam, different test papers are generally formed by randomly shuffling the sequence numbers of the test questions (or the sequence of candidate answers). Although the existing anti-cheating methods can play a certain role, the description of the title generally remains unchanged, so that students can still plagiarize according to the title and candidate answers. In addition, in the prior art, the stem description form of the question is single, which cannot fully test the students' understanding and mastery of the knowledge points. Contents of the invention [0003] Embodiments of the present disclosure provide a method and device for generating test questions, which can solve the problems in the prior ...

Claims

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Application Information

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IPC IPC(8): G06F16/33G06F16/35G06F40/194G06F40/247G06F40/279G06F40/30
CPCG06F16/3344G06F16/35G06F40/194G06F40/247G06F40/279G06F40/30
Inventor 湛志强张柳新高菁华常新峰
Owner LENOVO (BEIJING) CO LTD
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