A Training System of Serial Image Data Based on Synchronization Word

Abstract

A synchronization word-based serial image data training system, involving a CMOS image sensor training system, solves the problem that the existing CMOS detectors have large temperature changes or thermal control measures cannot ensure that the detectors change within a small temperature range. During the imaging process, there is a problem of garbled images due to temperature drift. The system includes imaging detectors, driving and control circuits, imaging controllers, memory and digital transmission interface circuits; the driving and control signals generated by the imaging controller, After being driven and controlled by the circuit, it is sent to the imaging detector; the digital image data output by the imaging detector is processed by the imaging controller, and then output through the digital transmission interface circuit; Clock word correction stage, channel correction stage based on synchronous word, and training result writing stage; the present invention can adapt to wide-range temperature changes without special dynamic training.

Description

technical field [0001] The invention relates to a training system of a CMOS image sensor, in particular to a training system of serial image data based on a synchronous word. Background technique [0002] CMOS image sensor applications usually output digital image data directly. Due to the high number of quantized digits and the large amount of data, digital image data is often transmitted in a serial manner. At the receiving end, serial-to-parallel conversion of the input serial image data is required, and the adaptive adjustment process of correctly converting serial data into parallel data is called training. [0003] In the application of high horizontal frequency, the serial clock frequency of CMOS detector is high, and the margin of serial image data sampling is small. When the temperature of the detector changes greatly or the thermal control measures cannot ensure that the detector changes within a small temperature range, the image may become blurred due to temper...

AI Technical Summary

Problems solved by technology

[0005] The present invention aims to solve the existing problem that the temperature of the CMOS detector changes greatly or the thermal control measures cannot ensure that the detector changes within a small temperature range, resulting in garbled images in the imaging process due to temperature drift, and provides A Training System of Serial Image Data Based on Synchronization Word

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