Magnetic light angle measurement system and method based on quantum weak measurement

A measurement method and measurement system technology, which is applied in the measurement of magnetic variables, measurement devices, and the size/direction of the magnetic field, can solve the problem of limiting the measurement accuracy of the magneto-optical effect, and the inability to separate the magneto-optic rotation angle and magneto-optic ellipticity at the same time. Accurate measurement and other issues, to achieve the effect of good application prospects, high sensitivity, wide application prospects

Active Publication Date: 2022-08-09
SICHUAN UNIV
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Problems solved by technology

[0006] Aiming at the problem that the classic magneto-optical effect measurement technology in the prior art cannot separate and measure the magneto-optic rotation angle and magneto-optic ellipticity at the same time with high precision, which limits the measurement accuracy of the magneto-optic effect, the purpose of the present invention is to break through the existing magnetic The accuracy limit of optical effect measurement technology provides a complex magneto-optical angle measurement system and method based on quantum weak measurement. Through this measurement system, the parameters of magneto-optical rotation angle and magneto-optical ellipticity can be separated, and then the magneto-optical angle can be measured simultaneously. High-precision Measurement of Optical Rotation Angle and Magneto-Optical Ellipticity

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  • Magnetic light angle measurement system and method based on quantum weak measurement
  • Magnetic light angle measurement system and method based on quantum weak measurement
  • Magnetic light angle measurement system and method based on quantum weak measurement

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Embodiment 1

[0048] The complex magneto-optical angle measuring device based on quantum weak measurement provided in this embodiment is suitable for measuring the complex magneto-optical angle in the magneto-optical Kerr effect (reflection method), such as figure 1 and figure 2 As shown, it includes a light-emitting device, a polarization state preparer 3 , an electromagnetic field generating device 8 , a phase adjusting device 4 , a time delay device 5 , a polarization state detector 6 and a photodetector 7 .

[0049] The light-emitting device is used to provide a light beam, and includes a light source generator 1 and a light intensity attenuator 2 arranged in sequence. The light source generator 1 is mainly used to provide a polarized light source. In this embodiment, the light source generator 1 can emit a collimated light beam with a center wavelength of 633 nm and a spectral width of 10 nm. The light intensity attenuator 2 is used to attenuate the light power emitted by the light s...

Embodiment 2

[0058] The complex magneto-optical angle measuring device based on quantum weak measurement provided in this embodiment is suitable for measuring the complex magneto-optical angle in the magneto-optical Faraday effect (transmission method), such as image 3 and Figure 4 As shown, it includes a light-emitting device, a polarization state preparer 3 , an electromagnetic field generating device 8 , a phase adjusting device 4 , a time delay device 5 , a polarization state detector 6 and a photodetector 7 .

[0059] The light-emitting device is used to provide a light beam, and includes a light source generator 1 and a light intensity attenuator 2 arranged in sequence. The light source generator 1 is mainly used to provide a polarized light source. In this embodiment, the light source generator 1 can emit a collimated light beam with a center wavelength of 633 nm and a spectral width of 10 nm. The light intensity attenuator 2 is used to attenuate the light power emitted by the li...

Embodiment 3

[0067] The complex magneto-optical angle measurement method based on quantum weak measurement provided in this embodiment is measured based on the measurement device provided in Embodiment 1, and specifically includes the following steps:

[0068] Step 1. Initial setting

[0069] The sample 9 to be tested is placed in the working cavity of the electromagnetic field generating device according to the set direction, and under the condition of zero magnetic field, the light-emitting device is activated, and the light-emitting device emits a collimated beam with a center wavelength of 633 nm and a spectral width of 10 nm. The plane-polarized light transformed into the horizontal polarization state |H> by the polarization state preparer 3 is incident on the surface of the sample 9 to be tested, and the plane-polarized light reflected by the surface of the sample is converted into elliptically polarized light, and after the reflected light passes through the time delay device 5, The...

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Abstract

The present invention disclosed a variety of magnetic light angle measurement system and methods based on a weak measurement of quantum measuring. The measurement system includes a luminous device used to provide beam, polarizing preparatory device for preparation of plane polarized light, and electromagnetic fields used to provide magnetic fields to provide magnetic fieldsIn the event of a device, a phase adjustment device for the two vertical polarization components of the beam to generate the π / 2 phase difference is used to adjust the time delay of the two vertical polarization component phase difference between the two vertical polarization components of the beam and use it to projected the beam to determinePolarized polarization detectors and photoelectric detectors for detecting and processing spectral distribution.Using the aforementioned measurement system, the parameters of the magnetic light rotation angle and the magnetic light oval rate can be separated, and then the high -precision measurement of the magnetic light rotation angle and the magnetic light oval rate.

Description

technical field [0001] The invention belongs to the technical field of optical instruments, relates to a complex magneto-optical angle measuring instrument, in particular to a complex magneto-optical angle measuring system and method based on quantum weak measurement. Background technique [0002] With the wide application of magneto-optical devices such as magneto-optical storage devices, magneto-optical sensing devices, and spintronic devices in information, medical, national defense and other technical fields, high-performance magnetic materials, as well as high-precision, high-sensitivity magneto-optical measurement technology increasingly urgent needs. The magneto-optical characterization technology based on the magneto-optical Kerr effect realizes non-destructive testing of magneto-optical material devices by measuring new optical phenomena generated by the interaction of light and magneto-optical materials, and the magneto-optical characterization technology has high ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N21/21G01R33/032
CPCG01N21/21G01R33/0325
Inventor 张志友何宇
Owner SICHUAN UNIV
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