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Quantum weak measurement-based complex magneto-optical angle measurement system and method

A measurement system and weak measurement technology, applied in the measurement of magnetic variables, measurement devices, the size/direction of the magnetic field, etc., can solve the problem of inability to separate the magneto-optical rotation angle and magneto-optical ellipticity while measuring with high accuracy and limiting the magneto-optical effect Measurement accuracy and other issues, to achieve the effect of good application prospects, high sensitivity, wide application prospects

Active Publication Date: 2021-10-29
SICHUAN UNIV
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  • Description
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  • Application Information

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Problems solved by technology

[0006] Aiming at the problem that the classic magneto-optical effect measurement technology in the prior art cannot separate and measure the magneto-optic rotation angle and magneto-optic ellipticity at the same time with high precision, which limits the measurement accuracy of the magneto-optic effect, the purpose of the present invention is to break through the existing magnetic The accuracy limit of optical effect measurement technology provides a complex magneto-optical angle measurement system and method based on quantum weak measurement. Through this measurement system, the parameters of magneto-optical rotation angle and magneto-optical ellipticity can be separated, and then the magneto-optical angle can be measured simultaneously. High-precision Measurement of Optical Rotation Angle and Magneto-Optical Ellipticity

Method used

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  • Quantum weak measurement-based complex magneto-optical angle measurement system and method
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  • Quantum weak measurement-based complex magneto-optical angle measurement system and method

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Embodiment 1

[0048] The complex magneto-optical angle measurement device based on the quantum weak measurement provided by the present embodiment is applicable to the measurement of the complex magneto-optic angle in the magneto-optical Kerr effect (reflection method), such as figure 1 and figure 2 As shown, it includes a light emitting device, a polarization state generator 3 , an electromagnetic field generating device 8 , a phase adjusting device 4 , a time delay device 5 , a polarization state detector 6 and a photodetector 7 .

[0049] The light emitting device is used to provide light beams, and includes a light source generator 1 and a light intensity attenuator 2 arranged in sequence. The light source generator 1 is mainly used to provide a polarized light source. In this embodiment, the light source generator 1 can emit a collimated light beam with a center wavelength of 633 nm and a spectral width of 10 nm. The light intensity attenuator 2 is used to attenuate the light power e...

Embodiment 2

[0058] The complex magneto-optical angle measuring device based on the quantum weak measurement provided by the present embodiment is applicable to the measurement of the complex magneto-optic angle in the magneto-optical Faraday effect (transmission method), such as image 3 and Figure 4 As shown, it includes a light emitting device, a polarization state generator 3 , an electromagnetic field generating device 8 , a phase adjusting device 4 , a time delay device 5 , a polarization state detector 6 and a photodetector 7 .

[0059] The light emitting device is used to provide light beams, and includes a light source generator 1 and a light intensity attenuator 2 arranged in sequence. The light source generator 1 is mainly used to provide a polarized light source. In this embodiment, the light source generator 1 can emit a collimated light beam with a center wavelength of 633 nm and a spectral width of 10 nm. The light intensity attenuator 2 is used to attenuate the light powe...

Embodiment 3

[0067] The complex magneto-optical angle measurement method based on quantum weak measurement provided in this embodiment is measured based on the measurement device provided in Embodiment 1, and specifically includes the following steps:

[0068] Step 1. Initial state setting

[0069] Place the sample 9 to be tested in the working chamber of the electromagnetic field generating device according to the set direction, start the light emitting device under the condition that the magnetic field is zero, and the light emitting device emits a collimated beam with a center wavelength of 633nm and a spectral width of 10nm. The plane polarized light that becomes horizontally polarized | H> by the polarization state generator 3 is incident on the surface of the sample 9 to be tested, and the plane polarized light reflected by the sample surface is converted into elliptical polarized light, and the reflected light passes through the time delay device 5, and then The outgoing light is pr...

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Abstract

The invention discloses a quantum weak measurement-based complex magneto-optical angle measurement system and method. The measurement system comprises a light emitting device used for providing a light beam, a polarization state preparation device used for preparing plane polarization light, an electromagnetic field generation device used for providing a magnetic field, a phase adjusting device used for enabling two mutually perpendicular polarization components of the light beam to generate a pi / 2 phase difference, a time delay device used for adjusting the phase difference of two mutually perpendicular polarization components of the light beam, a polarization state detector used for projecting the light beam to a determined polarization state, and a photoelectric detector used for detecting and processing spectral distribution. By means of the measurement system, parameter separation can be conducted on a magneto-optical rotation angle and a magneto-optical ellipsometry, so that high-precision measurement of the magneto-optical rotation angle and the magneto-optical ellipsometry is achieved.

Description

technical field [0001] The invention belongs to the technical field of optical instruments, and relates to a complex magneto-optic angle measuring instrument, in particular to a complex magneto-optic angle measuring system and method based on quantum weak measurement. Background technique [0002] With the wide application of magneto-optical devices such as magneto-optical storage devices, magneto-optical sensor devices, and spintronic devices in information, medical, national defense and other technical fields, high-performance magnetic materials, as well as high-precision, high-sensitivity magneto-optical measurement technology needs are becoming increasingly urgent. The magneto-optical characterization technology based on the magneto-optical Kerr effect realizes the non-destructive detection of magneto-optical material devices by measuring the new optical phenomenon generated by the interaction between light and magneto-optical materials, and the magneto-optic characteriz...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/21G01R33/032
CPCG01N21/21G01R33/0325
Inventor 张志友何宇
Owner SICHUAN UNIV
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