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RFID chip impedance and sensitivity test method, device and electronic equipment

A test method and sensitivity technology, applied in the field of chip testing, can solve the problems of difficult and efficient testing of the correct impedance value and sensitivity of tag chips, unfavorable design of performance antennas, etc.

Active Publication Date: 2022-07-08
BEIJING SMARTCHIP MICROELECTRONICS TECH COMPANY +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0002] The conjugate matching degree between RFID (Radio Frequency Identification, radio frequency identification) tag antenna and chip is very important to the performance of the tag. The higher the accuracy of the chip, the better the performance of the chip. In order to accurately measure the chip Chip engineers and tag antenna engineers have conducted long-term exploration. The patent document with the announcement number CN108107339B obtains the calculated value of tag sensitivity by traversing the chip impedance value and chip sensitivity, and compares the test value of tag sensitivity with the Calculate the value to determine the correct chip impedance value and chip sensitivity, but this method needs to traverse the chip impedance value and chip sensitivity to determine the correct chip impedance value and chip sensitivity. Therefore, antenna engineers need to conduct multiple impedance matching explorations, which is difficult to quickly and efficiently Test the correct impedance value and sensitivity of the tag chip, which is not conducive to designing an antenna with excellent performance and obtaining a tag with higher sensitivity

Method used

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  • RFID chip impedance and sensitivity test method, device and electronic equipment
  • RFID chip impedance and sensitivity test method, device and electronic equipment
  • RFID chip impedance and sensitivity test method, device and electronic equipment

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Embodiment Construction

[0037] The following describes in detail the embodiments of the present invention, examples of which are illustrated in the accompanying drawings, wherein the same or similar reference numerals refer to the same or similar elements or elements having the same or similar functions throughout. The embodiments described below with reference to the accompanying drawings are exemplary, and are intended to explain the present invention and should not be construed as limiting the present invention.

[0038] The following describes the method, device, electronic device, and computer-readable storage medium for testing the impedance and sensitivity of an RFID chip provided by the embodiments of the present invention with reference to the accompanying drawings.

[0039] figure 1 It is a flow chart of a method for testing impedance and sensitivity of an RFID chip according to an embodiment of the present invention. like figure 1 As shown, the method for testing the impedance and sensit...

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Abstract

The invention discloses a method, device and electronic equipment for testing the impedance and sensitivity of an RFID chip, wherein the method comprises: acquiring the antenna impedance value and antenna gain of each public label antenna in at least three public label antennas; The label sensitivity of each of the at least three labels formed after each of the chips is connected with at least three public label antennas, wherein the plurality of chips includes the chip to be tested and at least one chip of the same type as the chip to be tested ; Obtain the chip impedance value and chip sensitivity of each chip in the multiple chips according to the label sensitivity, antenna impedance value and antenna gain; obtain the chip impedance of the chip to be tested according to the chip impedance value and chip sensitivity of each chip in the multiple chips value and chip sensitivity. In this way, the impedance value and the chip sensitivity of the chip can be accurately and efficiently tested, which is beneficial to designing an antenna with better performance and obtaining a tag with higher sensitivity.

Description

technical field [0001] The invention relates to the technical field of chip testing, in particular to a method, device and electronic equipment for testing the impedance and sensitivity of an RFID chip. Background technique [0002] The conjugate matching between the tag antenna of RFID (Radio Frequency Identification, radio frequency identification) and the chip is very important to the performance of the tag. The higher the accuracy of the chip, the better the performance of the chip. In order to accurately measure the chip Chip engineers and tag antenna engineers have conducted long-term explorations of the impedance value and sensitivity of Calculate the value to determine the correct chip impedance value and chip sensitivity, but this method needs to traverse the chip impedance value and chip sensitivity to determine the correct chip impedance value and chip sensitivity. Therefore, the antenna engineer needs to conduct multiple impedance matching explorations, which is ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R27/02G01R31/28G06K17/00
CPCG01R27/02G01R31/2851G06K17/0029
Inventor 李建强赵军伟王文赫杜鹃林杰刘俊杰皮建
Owner BEIJING SMARTCHIP MICROELECTRONICS TECH COMPANY