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Universal JTAG debugging card and test method thereof

A test method and technology for debugging cards, which are applied in the directions of error detection/correction, detection of faulty computer hardware and instruments, etc., can solve problems such as reducing the time limit of board debugging, improving the difficulty of board debugging, fault location and abnormal processing, etc.

Pending Publication Date: 2022-02-18
西安超越申泰信息科技有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

These integrated circuits, which easily integrate tens of thousands of electronic components, can realize complex functions by configuring peripherals, such as CPU, GPU, etc., which not only simplifies the difficulty of circuit design for hardware engineers, but also improves board debugging, fault location, abnormality, etc. The difficulty of processing, what's more, requires chip manufacturers to participate in problem troubleshooting, and perform in-depth analysis and positioning at the register level, which greatly reduces the timeliness of board debugging

Method used

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  • Universal JTAG debugging card and test method thereof

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Effect test

Embodiment 1

[0027] combined with figure 1 , the present embodiment proposes a general-purpose JTAG debug card, which has a JTAG interface, an information processing unit, and an uplink USB interface;

[0028] The general-purpose JTAG debug card communicates with the JTAG chip on the board through the JTAG interface;

[0029] The information processing unit obtains the register status information of the JTAG chip on the board through a broadcast;

[0030] The general-purpose JTAG debug card transmits the register information obtained from the JTAG chip to the external host computer software through the upstream USB interface. The host computer software integrates the register function definition information of the JTAG chip, which is used to parse the received information into function configuration information and display it to the user. before.

[0031] One, two, or even multiple JTAG chips can be arranged on the board. In this embodiment, three JTAG chips are referred to as JTAG chip ...

Embodiment 2

[0033] combined with figure 1 , the present embodiment proposes a test method based on a general-purpose JTAG debug card, and the realization of the test method is based on three parts of a board, a general-purpose JTAG debug card, and host computer software, wherein:

[0034] A JTAG chip is arranged on the board;

[0035] The general-purpose JTAG debug card has a JTAG interface, an information processing unit, and an uplink USB interface. The general-purpose JTAG debug card communicates with the JTAG chip on the board through the JTAG interface. Register status information, the general-purpose JTAG debug card transfers the register information of the JTAG chip to the external host computer software through the uplink USB interface;

[0036] The upper computer software integrates the register function definition information of the JTAG chip, which is used to parse the received information into function configuration information and display it in front of the user, so that the...

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Abstract

The invention discloses a universal JTAG debugging card, and relates to the technical field of board card debugging. The universal JTAG debugging card is provided with a JTAG interface, an information processing unit and an uplink USB interface; the universal JTAG debugging card is in communication connection with a JTAG chip on the board card through the JTAG interface; the information processing unit acquires register state information of the JTAG chip on the board card through one-time broadcast issuing; and the universal JTAG debugging card transmits obtained register information of the JTAG chip to external upper computer software through an uplink USB interface, and the upper computer software integrates register function definition information of the JTAG chip and is used for analyzing received information into function configuration information and displaying the function configuration information in front of a user. The invention further discloses a test method based on the universal JTAG debugging card.

Description

technical field [0001] The invention relates to the technical field of board card debugging, in particular to a general-purpose JTAG debugging card and a testing method thereof. Background technique [0002] At present, the semiconductor manufacturing industry is developing in full swing, and advanced manufacturing processes are constantly being developed. 10nm, 7nm, 7nm+, and 5nm will be trial-produced next year. More and more large-scale integrated circuit chips are being pushed to hardware engineers. The era of discrete component construction principles has gradually passed, and large-scale integrated circuits have become the mainstream. These integrated circuits, which easily integrate tens of thousands of electronic components, can realize complex functions by configuring peripherals, such as CPU, GPU, etc., which not only simplifies the difficulty of circuit design for hardware engineers, but also improves board debugging, fault location, abnormality, etc. The difficu...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/22
CPCG06F11/221G06F11/2236G06F11/2205G06F11/2247
Inventor 刘相聪夏伟强梁记斌
Owner 西安超越申泰信息科技有限公司
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