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Method for quick quantitative mesuring content of rutile type and anatase type in T10*

A rutile type, quantitative determination technology, applied in the direction of material analysis using radiation diffraction, etc., can solve problems such as inappropriateness, and achieve convenient operation, fast speed, and favorable results in the determination of product quality

Inactive Publication Date: 2006-03-01
攀枝花钢铁有限责任公司钢铁研究院
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Problems solved by technology

[0007] In order to overcome the existing X - X-ray powder crystal diffraction quantitative analysis method needs standard sample and is not suitable for TiO 2 Medium rutile TiO 2 and anatase TiO 2 Insufficiency of rapid quantitative analysis determination of content, the present invention provides a kind of need not standard sample, utilizes X - X-ray powder diffraction analysis of TiO 2 Medium rutile TiO 2 and anatase TiO 2 Method for rapid quantitative determination of content

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  • Method for quick quantitative mesuring content of rutile type and anatase type in T10*
  • Method for quick quantitative mesuring content of rutile type and anatase type in T10*
  • Method for quick quantitative mesuring content of rutile type and anatase type in T10*

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Embodiment

[0030] Example: TiO 2 A rapid quantitative method for the determination of rutile and anatase content in rutile TiO using the powder crystal diffraction JCPDS card index public database 2 and anatase TiO 2 with α-Al 2 o 3 X-ray powder diffraction line cumulative intensity ratio I R / I C = 3.40 and I A / I C =4.30, adopt the following steps to carry out quantitative determination:

[0031] (1) the above-mentioned X-ray powder diffraction line cumulative intensity ratio I R / I C = 3.40 and I A / I C =4.30, converted into rutile TiO 2 and anatase TiO 2 The K value between, that is (I R / I C ) / (I A / I C ) = I R / I A =0.7907, take K=0.791;

[0032] (2) Set the TiO to be tested 2 Rutile TiO in powder or titanium dioxide 2 and anatase TiO 2 The sum of the contents is 100%, that is, X R +X A = 1;

[0033] (3) the TiO to be tested 2 Powder or titanium dioxide made into powder sample, in X - Measurement of rutile TiO on ray diffractometer 2 (110) surface, anata...

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Abstract

IR / IC and IA / IC are integrated intensity ratio between rutile type TiO2 (R) and X ray powder line of third material, as well as anatase typeYiO2 (A) and X ray powder line of third material respectively. IR / IC and IA / IC are converted to K value being as 0.971. Integrated intensities of X ray powder line IR and IA are measured for (110) face of TiO2 and face of TiO2 so as to calculate out contents of rutile type TiO2 and anatase typeYiO2 in TiO2 powder and titanium white powder. The invention features of simple, easy and fast.

Description

technical field [0001] The present invention relates to a method using X - X-ray powder crystal diffraction analysis (XRD) is a method for quantitatively determining the content of different phases in a sample, especially using X - X-ray powder diffraction analysis (XRD) on TiO 2 Medium rutile TiO 2 and anatase TiO 2 Rapid quantitative determination method. Background technique [0002] TiO 2 It is a widely used chemical product with two crystal forms: rutile and anatase. Due to the different structures of these two crystal forms, their chemical properties and uses are also different. Different crystal forms and contents can be used for chemical catalysts, papermaking, cosmetics, paints, plastics, enamel, welding rod flux, and electrical components. Additives etc. Therefore, the need for TiO 2 Rutile TiO in R&D, production process and products 2 and anatase TiO 2 rapid determination of content. Rutile TiO 2 and anatase TiO 2 It is an isomer with the same composi...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N23/20
Inventor 易礼均
Owner 攀枝花钢铁有限责任公司钢铁研究院
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