CMP conditioner
Patent Information
- Authority / Receiving Office
- US · United States
- Patent Type
- Patents(United States)
- Current Assignee / Owner
- MITSUBISHI MATERIALS CORP
- Publication Date
- 2006-12-19
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Abstract
Description
BACKGROUND OF THE INVENTION
[0001] 1. Field of the Invention
[0002] The present invention relates to a CMP conditioner that is used in the conditioning of polishing pads of a chemical mechanical polishing (CMP) apparatus that polishes semiconductor wafers and the like.
[0003] Priority is claimed on Japanese Patent Application No. 2004-274912, filed Sep. 22, 2004, the contents of which are incorporated herein by reference.
[0004] 2. Description of Related Art
[0005] For this type of CMP conditioner, a technology has been proposed, for example, in patent document 1 (Japanese Unexamined Patent Application, First Publication No. 2001-71267) in which, in a pad conditioning diamond dresser in which a single layer of diamond grit is adhered to a base metal operating surface of a disk-shaped or cup-shaped base metal by nickel plating, 70% or more of the adhered diamond grit has ridges or peaks of crystals as protruding ends. Moreover, in patent document 2 (Japanese Unexamined Patent Application, Firs...