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Voltage measuring apparatus for semiconductor integrated circuit and voltage measuring system having the same

a voltage measurement and integrated circuit technology, applied in the direction of individual semiconductor device testing, noise figure or signal-to-noise ratio measurement, instruments, etc., can solve the problems of noise or cross-talk, the external power source voltage level supplied to individual regions of the semiconductor integrated circuit can change, performance problems and even device failures

Inactive Publication Date: 2011-09-06
SK HYNIX INC
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

As a result, noise or cross-talk can effect various elements and lines within the chip.
For example, such noise can cause the external power source voltage level supplied to individual regions of the semiconductor integrated circuit can change.
Such variations in the power source voltage can cause performance issues and even device failures.
Despite such adverse effect, a technology that measures the change in voltage level due to noise has not been actively developed.
However, due to demands for high speed, high integration, and low power consumption of more modern semiconductor integrated circuits, the impact of such adverse effects is much more significant.
However, conventional methods to achieve the lower source voltage levels can cause signal distortion, and are therefore not very effective.

Method used

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  • Voltage measuring apparatus for semiconductor integrated circuit and voltage measuring system having the same
  • Voltage measuring apparatus for semiconductor integrated circuit and voltage measuring system having the same
  • Voltage measuring apparatus for semiconductor integrated circuit and voltage measuring system having the same

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BRIEF DESCRIPTION OF THE DRAWINGS

[0012]Features, aspects, and embodiments are described in conjunction with the attached drawings, in which:

[0013]FIGS. 1A and 1B are diagrams showing example semiconductor integrated circuits with external power source;

[0014]FIG. 2 is a block diagram showing the configuration of a voltage measuring apparatus for use with the semiconductor integrated circuit shown in FIGS. 1A and 1B;

[0015]FIG. 3 is a schematic diagram showing the detailed configuration of an analysis unit included in the apparatus of FIG. 2; and

[0016]FIG. 4 is a diagram illustrating the operation of the voltage measuring apparatus shown in FIG. 2.

DETAILED DESCRIPTION

[0017]FIG. 1 is a diagram illustrating an example voltage measuring apparatus in accordance with one embodiment. Referring to FIG. 1A, a semiconductor integrated circuit 4 is mounted on a mother board 2. The semiconductor integrated circuit 4 is supplied with an external power source voltage VDD from a power supply appar...

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Abstract

A voltage measuring apparatus for a semiconductor integrated circuit includes a first delay unit configured to delay a reference clock in a first region, a second delay unit configured to delay the reference clock in a second region and an analysis unit configured to analyze a difference in voltage level between the regions based on the phases of associated with the delayed clock signals generated by the first and second delay units.

Description

CROSS-REFERENCE TO RELATED PATENT APPLICATION[0001]This application claims the benefit under 35 U.S.C. 119(a) of Korean Patent Application No. 10-2007-0036334, filed on Apr. 13, 2007, in the Korean Intellectual Property Office, the disclosure of which is incorporated herein in its entirety by reference as if set forth in full.BACKGROUND[0002]1. Technical Field[0003]The embodiments described herein relate to a voltage measuring apparatus for a semiconductor integrated circuit and a voltage measuring system having the same. In particular, the present invention relates to a voltage measuring apparatus for a semiconductor integrated circuit that can measure a change in voltage level due to noise, and a voltage measuring system having the same.[0004]2. Related Art[0005]Conventional semiconductor integrated circuits are becoming more integrated, meaning an even larger number of components are being squeezed into even smaller areas within the semiconductor integrated circuit. As a result, ...

Claims

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Application Information

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Patent Type & Authority Patents(United States)
IPC IPC(8): G01R25/00
CPCG01R31/3004G01R29/26G01R19/00
Inventor KIM, HYUNG-SOOKIM, YONG-JUKIM, JONG-WOONSONG, HEE-WOONGOH, IC-SUHWANG, TAE-JIN
Owner SK HYNIX INC