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Method and arrangement for outputting residual errors for a function customized to a set of points

a function and residual error technology, applied in the field of methods and arrangements for displaying residual errors of functions, can solve the problems of difficult visual assignment of residual errors to the fitted function, observer difficulty in distinguishing the quality of the fit of the function to the data points, etc., and achieves the effect of simple and accurate visual assessment of the quality of the fi

Active Publication Date: 2014-02-18
CARL ZEISS MICROSCOPY GMBH
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Benefits of technology

The invention aims to improve a method and arrangement for visually assessing the quality of fit between two parts. The method involves assigning visual codes to the fit using a lookup table or a functional relationship. These codes can correspond to different deviations from the ideal fit. The display can be tailored to specific requirements, such as increasing or reducing the contrast for different needs. The observer can easily discern the residuals in the fitted function and assess the quality of the fit by observing only one individual graph. The display can also be larger for better visibility. The intensity or saturation of the visual code is determined based on the amount of residual error, allowing for easy identification of areas with positive or negative residual errors.

Problems solved by technology

These known forms of data display have the disadvantage that an observer has difficulty distinguishing the quality of the fit of the function to the data points.
With a two-dimensional fit, the visual assignment of the residual errors to the fitted function is particularly difficult because of the perspective and is therefore inaccurate.

Method used

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  • Method and arrangement for outputting residual errors for a function customized to a set of points
  • Method and arrangement for outputting residual errors for a function customized to a set of points
  • Method and arrangement for outputting residual errors for a function customized to a set of points

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Embodiment Construction

[0029]It is to be understood that the figures and descriptions of the present invention have been simplified to illustrate elements that are relevant for a clear understanding of the present invention, while eliminating, for purposes of clarity, many other elements which are conventional in this art. Those of ordinary skill in the art will recognize that other elements are desirable for implementing the present invention. However, because such elements are well known in the art, and because they do not facilitate a better understanding of the present invention, a discussion of such elements is not provided herein.

[0030]The present invention will now be described in detail on the basis of exemplary embodiments.

[0031]A graph of a function G(x,y) is shown in each FIG. 1A to 3A in a perspective pseudo-3D grid rendering. The respective function G(x,y) is fitted by means of curve fitting calculations to a set of data points (not shown) that is identical for all of the Figures, for example...

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Abstract

The invention is directed to a method and an arrangement for displaying residual errors of a function which is fitted to a set of points. In the prior art, the residual errors are displayed in a separate graph apart from the function graph so that it is difficult for an observer to discern the quality of the fit of the function to the data points. An improved method and an improved arrangement make it possible to visually assess the quality of the fit in a simple, accurate manner. According to the invention, visual codes are assigned to the fitted function or to the data points of the point set piecewise or pointwise depending on the residual errors, and the fitted function is displayed graphically at an interface, wherein the fitted function is displayed piecewise or pointwise in the form of the assigned visual codes. The invention is preferably used for raster image spectroscopy with laser scanning microscopes.

Description

[0001]The present application claims priority from PCT Patent Application No. PCT / EP2008 / 007701 filed on Sep. 16, 2008, which claims priority from German Patent Application No. 10 2007 045 666.4 filed on Sep. 25, 2007, the disclosure of which is incorporated herein by reference in its entirety.BACKGROUND OF THE INVENTION[0002]1. Field of the Invention[0003]The invention is directed to a method and an arrangement for displaying residual errors of a function which is fitted to a set of points.[0004]2. Description of Related Art[0005]A set of points comprises a plurality of discrete data points. At least two coordinates of a correspondingly multi-dimensional number space and a one-dimensional or multi-dimensional value are assigned to each of these points. The points can directly represent measurement data or can be derived indirectly from measurement data. A fitted function is an implicitly or explicitly defined assignment rule. It may or may not be constant and can be defined continu...

Claims

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Application Information

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Patent Type & Authority Patents(United States)
IPC IPC(8): G06T11/20
CPCG06T11/206
Inventor HEIDKAMP, MARCUSWAGNER-CONRAD, STEPHANWEISSHART, KLAUS
Owner CARL ZEISS MICROSCOPY GMBH
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