Detecting device and machine platform
A detection device and detection machine technology, which is applied in the direction of measuring devices, optical devices, instruments, etc., can solve problems such as uneconomical, substrate transfer drop, and huge transformation costs, so as to increase production capacity and reduce reading abnormalities.
Inactive Publication Date: 2009-12-23
AU OPTRONICS CORP
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Problems solved by technology
However, since the substrate flows in the opposite direction, if you want to install the backlight, you need to remove 2 to 3 transmission shafts to correspond to the substrates of different sizes, which will cause the substrate to be transported and fall. Therefore, the general backlight cannot be directly installed.
[0005] In addition, the rear positioning device can also be used to process the substrates that cannot be interpreted by machine vision through the rear positioning device. Although the manual processing steps can be eliminated, it will not cause the transfer to drop; cost, not economical
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[0027] Please refer to figure 1 and figure 2 For the first embodiment of the present invention, figure 1 is a stereogram, figure 2 Schematic diagram for the reflection principle, and please refer to Figure 3A and Figure 3B , Figure 3A In order to improve the previous label display state diagram, Figure 3B Show state diagram for improved labeling.
[0028] The detection device suitable for detecting marks on the substrate of the present invention includes, in this embodiment: a reflective element 10 , a light emitting element 20 , and an image pickup element 30 .
[0029] In this embodiment, the reflective element 10 is, for example, an electrostatic plate, and includes a fog surface 12 and a reflective surface 14 , the fog surface 12 is used to homogenize the light source, and the reflective surface 14 is used to reflect the light source. Wherein, the fog surface 12 is located on the surface of the electrostatic plate, and the reflective surface 14 is located on t...
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The invention discloses a detection device and a machine platform, especially a detection device and a machine platform for detecting marks on a substrate. A light-emitting element fixed on the side of an imaging element projects a light source at an oblique angle to the substrate and a transmission shaft fixed on it. When the conveying equipment transports the substrate to the reflective element, the imaging element captures the mark on the surface of the substrate, effectively reducing the abnormal reading of the imaging element and greatly increasing production capacity without removing the drive shaft or modifying hardware and software .
Description
technical field [0001] The invention relates to a detection device and a machine platform, in particular to a detection device and a machine platform suitable for detecting marks on a substrate. Background technique [0002] In recent years, nearly optical-grade glass substrates have been widely used, such as in flat-panel displays, biochips, micro-electromechanical and optical communication components, in order to make products made of glass substrates faster and more automated. , you must rely on the machine vision system to achieve the goal. [0003] Generally, when manufacturing, marks such as a cross mark or a two-dimensional barcode are first marked on the substrate. During the transfer process, the machine vision can interpret the position and related information of the substrate by capturing these marks. Occasionally, abnormalities will occur during the printing process, resulting in differences or blurring of the color of the 2D barcode. Abnormal two-dimensional ...
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IPC IPC(8): G01B11/00
Inventor 陈玟成
Owner AU OPTRONICS CORP