Method for establishing contour baseline in two-dimension surface roughness assessment
A surface roughness and contour reference line technology, applied in the field of contour reference line establishment, can solve problems such as uncertainty, contour reference line is not smooth, and surface functional characteristics are not considered
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[0045] The present invention will be described in further detail below.
[0046] Firstly, the principle of applying the gray method to establish the contour reference line for roughness evaluation is introduced. The two-dimensional surface profile is composed of low-frequency components such as surface waviness and profile shape error, and high-frequency components such as surface roughness. In the process of evaluating the surface roughness of two-dimensional contours, the sum of low-frequency components such as surface waviness and contour shape error is used as the baseline for roughness evaluation. Let x(t) be the contour curve of the surface to be evaluated, r(t) be the baseline for roughness evaluation, and s(t) be the surface roughness, then the mathematical model of the two-dimensional contour surface roughness evaluation can be expressed as: x(t)=r(t)+s(t) or s(t)=x(t)-r(t). r(t) in the mathematical model can be obtained by gray modeling of the contour curve x(t). ...
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