Multiple spectral section continuous tuning high resolution infrared laser spectral measuring system and method

An infrared laser and spectral measurement technology, which is applied in the field of gas laser spectral measurement systems, can solve the problems of limited output wavelength tuning range, inability to meet on-site detection, and multi-component detection.

Inactive Publication Date: 2007-12-19
ANHUI INST OF OPTICS & FINE MECHANICS - CHINESE ACAD OF SCI
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Problems solved by technology

However, there are still some shortcomings in traditional semiconductor lasers, which limit the specific application of semiconductor laser absorption spectroscopy technology.
Mainly: (1) The output wavelength tuning range of a single semiconductor laser is limited, generally only 3-5nm, and a laser can usually only detect a few absorption lines of a gas, which cannot me

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  • Multiple spectral section continuous tuning high resolution infrared laser spectral measuring system and method

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Embodiment Construction

[0015] See Figure 1

[0016] Labels in the figure: 1, optical platform 2, industrial control cabinet 3, industrial computer 4, wavelength meter 5, ECDL laser power controller 6, DFB laser power controller 7, near-infrared InGaAs PIN photodetector 8, DC power supply 9, medium Infrared thermoelectric cooling MCT photodetector 10, aspheric mirror 11, gas absorption cell 12, aspheric mirror 13, fiber optic collimating lens 14, 635nm visible light collimating laser 15, Ge filter 16, CaF 2Focusing lens 17, crystal heating furnace 18, crystal heating furnace temperature controller 19, fiber collimating lens 20, 635nm visible collimating laser 21, 1 / 2 wave plate 22, DFB laser 23, ECDL laser 24, rotatable mirror 25 , 1 / 2 wave plate 26, rotatable mirror 27, beam combiner 28, cemented focusing lens 29, PPLN nonlinear crystal 30, mirror 31, focusing lens 32, fiber coupler 33, gas absorption cell 34, focusing lens . Among the above-mentioned components, 3-6 are installed in the industria...

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Abstract

A spectrum measurement system with multi-spectrum section in infrared laser continuous tuning and high-resolution type is prepared as forming near infrared spectrum subsystem by ECDL laser, laser power supply, gas absorption pool, near infrared photoelectric detector, data collection- process circuit and computer; forming intermediate infrared spectrum subsystem by ECDL laser, DFB laser, laser power supply, 1/2 wave plate, beam combination mirror, achromatic glued mirror, PPLN nonlinear crystal, CaF2 lens, Ge filtering plate, non-spherical surface mirror, gas absorption pool, MCT photoelectric detector, etc.

Description

technical field [0001] The invention belongs to a gas laser spectrum measurement system, in particular to a multi-spectrum continuous tuning high-resolution infrared laser spectrum measurement system and method based on a near-infrared wide-tuning external cavity tuning semiconductor laser and a nonlinear optical difference frequency conversion method. Background technique [0002] Tunable semiconductor laser absorption spectroscopy (TDLAS) technology is a trace gas detection technology with high sensitivity, high resolution and fast response. Due to its unique advantages, it has potential important application value in many fields and is very popular in recent years. one of the research fields. The main applications are (1) obtaining molecular structure information, (2) studying its kinetic process, (3) trace gas monitoring and analysis. Tunable infrared laser spectroscopy has the advantages of high sensitivity, real-time, dynamic, multi-component simultaneous measurement....

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Application Information

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IPC IPC(8): G01N21/39
Inventor 刘文清陈东张玉钧崔小娟刘建国阚瑞峰王敏夏惠何莹
Owner ANHUI INST OF OPTICS & FINE MECHANICS - CHINESE ACAD OF SCI
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