Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Multifunctional combined testing moving group chain device

A combined testing action and multi-functional technology, applied in the direction of digital circuit testing, electronic circuit testing, etc.

Active Publication Date: 2008-02-06
DATANG MOBILE COMM EQUIP CO LTD +1
View PDF0 Cites 19 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0007] At present, there is a lack of a JTAG chain that not only supports the boundary scan test of the circuit, but also supports the download and debugging of JTAG devices using different debug connectors.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Multifunctional combined testing moving group chain device
  • Multifunctional combined testing moving group chain device
  • Multifunctional combined testing moving group chain device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0028] The core of the present invention is: between the serial pins of each JTAG device on the JTAG chain, between the connection circuit of the JTAG chain and the boundary scan connector, in each parallel branch of TMS / TCK of each JTAG device on the JTAG chain , connect a controllable switch in series, and connect the TDI, TDO, TMS and TCK pins of each JTAG device to the TDI, TDO, TMS and TCK pins of the corresponding debug connector, so that the controllable switch can be controlled Control, perform boundary scan of the circuit or download and debug each JTAG device on the JTAG chain.

[0029] The multi-functional JTAG chain device of the present invention will be further specifically described below in conjunction with Embodiment 1, taking a total of three JTAG devices in the circuit as an example.

[0030] Connect the three JTAG devices into a JTAG chain as shown in Figure 3. In FIG. 3 , debug connector 304 , debug connector 305 and debug connector 306 are used to downlo...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The present invention discloses a multi-function JTAG chain device comprising a boundary scan connector that is used for boundary scanning and at least two JTAG components which are connected to form a JTAG chain and are connected with the boundary scan connector. The device also comprises a controllable switch, a switch control device and a debugging connector that serves for the downloading and debugging of each JTAG component. A controllable switch is arranged in series respectively between the test data input TDI pin of the boundary scan connector and TDI pin of the JTAG component that is connected with the boundary scan connector; between test data output TDO pins in series of the JTAG chain and TDI pin; between TDO pins of the boundary scan connector and TDO pins of the JTAG component; and in each parallel-connection branch lines formed by the test mode selection input TMS / test clock input TCK pins and TMS / TCK pins of each JTAG component. All controllable switches are all under the control of the switch control device; TDI, TDO, TMS and TCK pins of each JTAG component are connected respectively with TDI, TDO, TMS and TCK pins of the debugging connector.

Description

technical field [0001] The invention relates to a joint test action group (JTAG, Joint Test Action Group) connection technology, in particular to a multifunctional JTAG chain device. Background technique [0002] JTAG is an international standard test protocol, mainly used for chip internal testing. At present, many complex devices support the JTAG protocol, such as DSP, FPGA and other devices. Generally, such devices supporting the JTAG protocol are called JTAG devices. The standard JTAG interface is 4 lines, including test mode selection input line (TMS), test clock input line (TCK), test data input line (TDI) and test data output line (TDO). It is very convenient to download and debug JTAG devices through the debug connector. [0003] What Figure 1 shows is a schematic diagram of the connection between the debug connector and the JTAG device. In FIG. 1 , the circuit includes three JTAG devices, namely JTAG device 101, JTAG device 103 and JTAG device 105, and three corr...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/28G01R31/317
Inventor 马卫国
Owner DATANG MOBILE COMM EQUIP CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com