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System and method for disfigurement pixel in pixel array

A technology of defective pixels and pixel arrays, which is used in parts of TV systems, image communication, parts of color TV, etc.

Inactive Publication Date: 2008-04-30
INT BUSINESS MASCH CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In addition, the solution requires the inclusion of fault analysis and correction systems on the same chip as the pixel array or on a separate chip

Method used

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  • System and method for disfigurement pixel in pixel array
  • System and method for disfigurement pixel in pixel array
  • System and method for disfigurement pixel in pixel array

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Embodiment Construction

[0029] The present invention relates generally to the field of imaging sensors, and more particularly to circuits for enhancing the yield and performance of CMOS imaging sensors. The present invention involves utilizing circuitry that is separate from and in communication with the pixel array. The present invention also relates to the use of e-fuse technology.

[0030]The present invention involves full function testing, dark current and optical testing, and color testing of pixel arrays prior to shipment. These tests are performed on a test system in which each pixel is illuminated with light of a certain wavelength and intensity. A system of row and column decoders is used to address each pixel in the pixel array. Required signals such as reset, transfer device gate, and row select signals are applied by drivers connected to the pixel array. Measure and identify the output from each pixel. These initial tests identify bad or defective pixels and, through the use of e-fus...

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Abstract

A system for replacing a defective pixels in a pixel array is presented. The system includes means for identifying a defective pixel in the pixel array, means for generating a code including information corresponding to the defective pixel row and column; means for decoding the information;, and means for generating a signal that permanently identifies the defective pixel row and column based on the decoded information. The system further includes means for substituting data from the defective pixel with data from a functioning pixel disposed in a same row as, and next to, the defective pixel based on the generated signal.

Description

technical field [0001] The present invention relates generally to the field of imaging sensors, and more particularly to circuits for enhancing the yield and performance of CMOS imaging sensors. Background technique [0002] In devices utilizing optical imaging sensors, there are several possible sources for yield loss or quality degradation of the output optical image. One source of yield loss is defective pixels. Defective pixels may be caused by excessively dark current flow, defects causing bright spot images, short circuits, or general defects in the silicon or metallization layers causing distortion of the optical image. [0003] Figure 1 shows a prior art layout of Y rows and X columns of an active array 100 of pixels 106a-t. The array of pixel columns is activated by a number of signals from vertical (column) scanning circuit 105, including transfer gate (TG) 122, reset gate (RG) 124, row select (RS) 125 and power supply Vdd 120, and The array of pixel rows is sca...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H04N5/335H04N17/00
CPCH04N5/367H04N5/2178H04N25/67H04N25/68
Inventor 瓦格蒂·W.·阿巴迪尔
Owner INT BUSINESS MASCH CORP