Intermittent disconnection testing system for electric contact piece

A technology for testing systems and electrical contacts, applied in the direction of measuring electricity, measuring devices, and measuring electrical variables, etc., can solve problems such as low efficiency and inaccurate test results of transient breaks, and achieve safe operation, convenient function expansion, and short operating time short effect

Inactive Publication Date: 2008-06-18
陕西永辉测控技术有限公司
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  • Abstract
  • Description
  • Claims
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Problems solved by technology

[0008] The present invention provides an electrical contact transient test system, which solves the technical problems of inaccurate transient test results and low efficiency in the background technology

Method used

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  • Intermittent disconnection testing system for electric contact piece
  • Intermittent disconnection testing system for electric contact piece

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Embodiment Construction

[0035] Referring to Fig. 1 and Fig. 2, a kind of electrical contact piece transient testing system includes a computer and a processor connected to the computer, and also includes an adapter converter connected to the computer, and the adapter converter includes two openable housings 1, see Figure 3 and Figure 4, one housing 1 is provided with an insulating inner core 2, and the other housing 1 is provided with a test needle 3; the processor includes a constant time signal source and a constant current that can simultaneously test the electrical contacts connected sequentially Circuit, detection amplifier circuit, logic circuit, signal processing circuit, program-controlled counting circuit and timer, the detection amplifier circuit is connected with a high-speed comparator, and the program-controlled counting circuit is provided with a single-chip microcomputer, and the single-chip microcomputer receives a jump signal sent by the high-speed comparator After counting once, the ...

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Abstract

An instantaneous turnoff test system for the electronic probe comprises a computer and an adapter connecting a processor and the computer. The adapter comprises two retractable casings, one casing is equipped with an insulating core, and the other casing is equipped with a testing needle. The processor comprises a signal source of the constant time, a successive connected constant current circuit, a detecting amplified circuit, a logic circuit, a signal processing circuit, a programmable counting circuit and a timer. The detecting amplified circuit is connected to a high speed comparator, the programmable counting circuit is equipped with a microcontroller, and the microcontroller counts once after the microcontroller receives a pulse input transmitted from the high speed comparator. The invention can be used to detect the various electronic probes including switch, connector, relay and cable assembly, and has the advantages of accurate test and high efficiency.

Description

technical field [0001] The invention relates to a test system for a contact piece of an electronic product, in particular to a test system for an electric contact piece instantaneous break. Background technique [0002] Electronic product contacts, such as various switches, connectors, relays, and cable assemblies, etc., have instantaneous power failures in practical applications. [0003] Momentary interruption is a common failure mode in interconnected circuits that contain electrical contacts. There are three contact forms of electrical contacts: point contact, line contact and surface contact. Regardless of the contact form, resistance will be generated at the contact position. Among all the factors affecting the contact resistance, the contact pressure is the main factor affecting the size of the contact resistance, and the corresponding contact resistance is "static contact resistance"; since the movement is absolute, in the actual vibration, impact, collision and oth...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/02G01R31/04
Inventor 冯军
Owner 陕西永辉测控技术有限公司
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