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Substance surface property parametric measurement method

A technology for parameter determination and surface properties, which is applied in the direction of measuring devices, measuring electrical variables, electrostatic field measurement, etc., can solve the problem of joint determination of five parameters, etc.

Active Publication Date: 2009-03-25
重庆为讯科学仪器有限责任公司
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

In the prior art, there is no method for joint determination of the above five parameters

Method used

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  • Substance surface property parametric measurement method
  • Substance surface property parametric measurement method
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Embodiment Construction

[0078] Hereinafter, preferred embodiments of the present invention will be described in detail with reference to the accompanying drawings.

[0079] The material surface property parameter determination method of the present embodiment comprises the following steps:

[0080] 1) Carry out saturation treatment on the surface of the object to be tested, specifically including the following steps:

[0081] 11) Take 3-5g of the sample to be tested and put it into the sample holding device, use 150-250ml of 0.1mol / l HCl solution to flow through the sample at a constant speed of 1ml / min, so that the surface charge of the sample to be tested is completely covered by H + and Cl - Saturated; HNO can also be used 3 The solution is saturated with the sample to be tested;

[0082] 12) Use 150-250ml of water to flow through the sample at a constant flow rate of 1ml / min to wash away excess H + and Cl - ;

[0083] 13) Use a constant flow pump to pump out the interstitial water in the ob...

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Abstract

The invention provides a general method for measuring material surface property parameters. The method can measure the surface electric potential of different types of materials under different conditions accurately. The method comprises the following steps: performing saturation treatment on the material surface to be determined; mixing the saturated material which is subjected to the saturation treatment and is to be determined with an indicating electrolyte solution; measuring equilibrium concentration values of cations and hydrogen ions in indicating electrolyte of the body solution of the mixture; calculating the material surface electric potential according to the equilibrium concentration values of the cations in the indicating electrolyte; in a further technical proposal, calculating material specific surface area and surface charge density according to the material surface potential, calculating material surface electric field intensity according to the material surface charge density, and calculating total material surface charge amount according to the surface charge density and the specific surface area. The method is obtained in the relevant technology field for the first time, which can be applied widely for measuring the surface property parameters of materials with different charge types and under different conditions, and can realize combined measurement.

Description

technical field [0001] The invention relates to the technical fields of colloid chemistry, interface chemistry and material science, in particular to a method for measuring surface parameters of substances. Background technique [0002] The surface properties of substances such as surface potential, total surface charge, surface charge density, surface electric field strength and specific surface area are not only important in scientific research in the fields of colloid and interface science, material science, life science, soil science, ecology and environmental science, etc. It is widely used in chemical engineering fields such as papermaking, cement, ceramics, chemical mechanical grinding, coal slurry, paint, cosmetics, food industry, mixed dispersion system, etc. Therefore, the determination of the surface property parameters of the above materials is particularly important. important. [0003] In the prior art, indicator ion adsorption method and potentiometric titrat...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R19/00G01R29/24G01R19/08G01R29/12G01N33/00
Inventor 李航朱华玲侯捷吴劳生
Owner 重庆为讯科学仪器有限责任公司
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