Digital oscilloscope with seamless measuring capability

Abstract

The invention provides a digital oscilloscope with seamless measurement capability. By further improving the system structure of the digital oscilloscope, the processing mechanism of the digital oscilloscope is optimized so that the requirements of seamless acquisition and storage, seamless data processing and seamless image display can be met simultaneously. That is, on the basis of the existing high waveform capture rate digital oscilloscope data processing task software, hardware division of labor, and parallel execution architecture, further improve the three modules of acquisition storage, data processing and image display, and propose a method that can be based on the sampling rate of the front-end ADC. It is a new type of digital oscilloscope that automatically and rationally configures acquisition memory and data processor resources in the back-end FPGA, optimizes data access and processing mechanisms, and improves image display methods. The capture rate completely eliminates the measurement gap, and truly has the seamless measurement capability.

Description

technical field [0001] The invention belongs to the technical field of digital oscilloscopes, and more specifically relates to a digital oscilloscope with seamless measurement capability. Background technique [0002] In recent years, with the rapid progress of high-speed sampling and related technologies, digital time-domain test instruments represented by digital oscilloscopes have been greatly developed and widely used. At the same time, modern electronic signals are becoming increasingly complex and diverse, the frequency range of the signal is constantly expanding, and the transient and non-stationary nature of the signal is constantly increasing. The resulting test requirements are constantly increasing, and the requirements for the measurement capabilities of the oscilloscope are getting higher and higher. [0003] In various fields such as communication, computer, multimedia, etc., for various test requirements such as high-speed signal measurement, occasional event ...

AI Technical Summary

Problems solved by technology

However, as mentioned above, the improvement of the digital oscilloscope’s waveform capture rate relative to the sampling rate of the existing technology is very limited, and the measurement gap of the digital oscilloscope still exists and is large, resulting in a low measurement capability and test efficiency of the digital oscilloscope.

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