Digital oscilloscope with seamless measuring capability

Abstract

The invention discloses a digital oscilloscope with the seamless measuring capability. By further improving the system structure of the digital oscilloscope and optimizing the processing mechanism of the digital oscilloscope, the digital oscilloscope can simultaneously meet the requirements of seamless acquisition storing, seamless data processing and seamless image displaying. On the basis of the system structure that the existing digital oscilloscope with high wave shape capture rate can process tasks in software and hardware working separately and parallel executing mode, an acquisition storing module, a data processing module and an image displaying module are further improved, and the digital oscilloscope can reasonably allocate resources of an acquisition storer and a data processor, optimize data storing and processing mechanisms and improve image displaying mode in a rear-end field programmable gate array (FPGA) automatically according to the front-end analog digital converter (ADC) sampling speed and seamless measuring requirements. The digital oscilloscope further improves the wave shape capture rate, thoroughly eliminates measuring seams and actually has the seamless measuring capability.

Description

technical field [0001] The invention belongs to the technical field of digital oscilloscopes, and more specifically relates to a digital oscilloscope with seamless measurement capability. Background technique [0002] In recent years, with the rapid progress of high-speed sampling and related technologies, digital time-domain test instruments represented by digital oscilloscopes have been greatly developed and widely used. At the same time, modern electronic signals are becoming increasingly complex and diverse, the frequency range of the signal is constantly expanding, and the transient and non-stationary nature of the signal is constantly increasing. The resulting test requirements are constantly increasing, and the requirements for the measurement capabilities of the oscilloscope are getting higher and higher. [0003] In various fields such as communication, computer, multimedia, etc., for various test requirements such as high-speed signal measurement, occasional event ...

AI Technical Summary

Problems solved by technology

However, as mentioned above, the improvement of the digital oscilloscope’s waveform capture rate relative to the sampling rate of the existing technology is very limited, and the measurement gap of the digital oscilloscope still exists and is large, resulting in a low measurement capability and test efficiency of the digital oscilloscope.

Images