A method for measuring change of fine structure constant and a system using the method

A technology of fine structure and measurement method, applied in the automatic control of power, electrical components, etc., can solve the problems of fine structure constant change deviation, unidirectional change, slow change of output frequency value, etc.

Active Publication Date: 2016-03-30
JIANGHAN UNIVERSITY
View PDF3 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Therefore, it is generally used to measure the change of the long-term frequency signal output of the atomic clock to measure the change of the fine structure constant. However, if an atomic clock works continuously for a long time, its output frequency value will change slowly over time, even in one direction. Variety
Therefore, if the frequency drift correction of multiple atomic frequency standards is not performed, the oscillation frequency output by multiple atomic clocks cannot be truly reflected, and the change of fine structure constants will have a large deviation

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A method for measuring change of fine structure constant and a system using the method
  • A method for measuring change of fine structure constant and a system using the method
  • A method for measuring change of fine structure constant and a system using the method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0032] A method for measuring changes in fine structure constants provided by an embodiment of the present invention. Include the following steps:

[0033]Include the following steps:

[0034] After the output frequency signal of the atomic clock physical system in the atomic clock group passes through the isolation amplifier, it is output to the counter group corresponding to the atomic clock for frequency measurement, and the counter group outputs the measured frequency to the microcontroller; the output after isolation and amplification The frequency signal is sent to the frequency stability tester in another way, and compared with the high-stable clock signal output by the high-stable signal source, the output frequency drift df of the atomic clock is obtained 1 output to the microcontroller;

[0035] The microcontroller drifts df according to the received output frequency 1 Corresponds to the daily average output frequency drift of the atomic clock stored in the microc...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention discloses a method for measuring the variation of fine structure constants and a system using the method, belonging to the technical field of atomic frequency standards. Including an atomic clock group composed of at least 2 atomic clocks, and a counter group composed of at least 2 counters; the atomic clock includes an atomic clock physical system, an isolation amplifier, a frequency stability tester, a high-stable signal source, a microcontroller, a D / A conversion module, Constant current source module. In the present invention, the microprocessor uses the counter group to measure the output frequencies of different types of atomic clocks in the atomic clock group after frequency drift correction, and the daily output frequency of each atomic clock is represented by the power series of the fine structure constant, Time-dependent changes in the fine structure constant are detected. The invention can truly reflect the change of the output frequency of multiple atomic clocks, and then accurately measure the change of the fine structure constant.

Description

technical field [0001] The invention relates to the technical field of atomic frequency standards, in particular to a method for measuring changes in fine structure constants and a system using the method. Background technique [0002] The fine structure constant is a fundamental physical constant of the interaction strength between atoms or molecules, which is defined as: [0003] α = e 2 4 π e 0 hc or α = e 2 2 e 0 hc [0004] Among them: e is the basic charge, e 0 is the vacuum permittivity, is the reduced Planck constant, h is Planck's constant, and c is the speed of light. [0005] According to the recommended va...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Patents(China)
IPC IPC(8): H03L7/26
Inventor 雷海东
Owner JIANGHAN UNIVERSITY
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap