Optical principle based fast plane deformation measuring device and method

A technology based on plane deformation and optical principles, applied in the field of optical measurement, can solve problems such as poor anti-interference ability, large measurement error, large nonlinearity, etc.

Inactive Publication Date: 2013-11-20
WENZHOU UNIVERSITY
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0003] At present, strain gauges are the most common deformation measuring instruments, but strain gauges generally have the following three disadvantages: 1. Temperature changes cause changes in the resistance of the strain gauge’s sensitive grid, and the linear expansion coefficients of the test piece mater

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  • Optical principle based fast plane deformation measuring device and method
  • Optical principle based fast plane deformation measuring device and method
  • Optical principle based fast plane deformation measuring device and method

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Embodiment Construction

[0028] The present invention will be described in further detail below in conjunction with the accompanying drawings and specific embodiments.

[0029] Such as figure 1 As shown, the present invention provides a quick measurement device for plane deformation based on the optical principle, including four nickel-cadmium plates arranged in a cross shape and a digital camera. Because the nickel-cadmium material has stable chemical properties, there is no obvious thermal expansion and cooling Shrinkage phenomenon, during the measurement, the nickel-cadmium plate itself does not deform.

[0030] The four nickel-cadmium plates include two horizontally arranged first nickel-cadmium plates 1 and the second nickel-cadmium plate 2, and two longitudinally arranged third nickel-cadmium plates 3 and the fourth nickel-cadmium plate 4, each nickel-cadmium plate A bolt groove 11 is provided on the cadmium plate, and a bolt 12 is installed in the bolt groove 11, and the bolt 12 can slide alon...

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Abstract

The invention provides an optical principle based fast plane deformation measuring device. The device comprises four nickel-cadmium plates which are of cruciform arrangement and a digital camera, wherein the four nickel-cadmium plates consists of a first nickel-cadmium plate, a second nickel-cadmium plate, a third nickel-cadmium plate and a fourth nickel-cadmium plate, the first nickel-cadmium plate and the second nickel-cadmium plate are arranged transversely, the third nickel-cadmium plate and the fourth nickel-cadmium plate are arranged longitudinally, each nickel-cadmium plate is provided with a bolt groove, and a bolt is mounted in each bolt groove and can slide along the corresponding bolt groove; a first transverse marker and a second transverse marker are fixedly arranged on the first nickel-cadmium plate, and a third transverse marker is fixedly arranged on the second nickel-cadmium plate; a first longitudinal marker and a second longitudinal marker are fixedly arranged on the third nickel-cadmium plate, and a third longitudinal marker is fixedly arranged on the fourth nickel-cadmium plate. The device can be used for repeatedly measuring the deformation of a planar structure at different positions and has the characteristics of simplicity in operation, low cost, high temperature resistance, high accuracy and the like. The invention further provides an optical principle based fast plane deformation measuring method.

Description

technical field [0001] The invention belongs to the field of optical measurement, and in particular relates to a fast measurement device and method for plane deformation based on optical principles. Background technique [0002] Deformation is a ubiquitous phenomenon in nature. It refers to the change of shape, size and position of a deformed object in the time and space domains under various loads. In the field of engineering, when the amount of deformation does not exceed a certain range, it will not cause harm; if it exceeds the allowable value that the deformed body can bear, it may cause serious disasters. Therefore, it is very important to carry out regular deformation measurement on the structure. [0003] At present, strain gauges are the most common deformation measuring instruments, but strain gauges generally have the following three disadvantages: 1. Temperature changes cause changes in the resistance of the strain gauge’s sensitive grid, and the linear expansio...

Claims

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Application Information

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IPC IPC(8): G01B11/16
Inventor 周华飞秦良忠豆红尧谢子令
Owner WENZHOU UNIVERSITY
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