A method for estimating circuit yield based on cad Monte Carlo analysis

A technology of Monte Carlo analysis and circuit yield, applied in calculation, electrical digital data processing, special data processing applications, etc., can solve problems such as analysis result error, circuit complexity, and circuit simulation times

Active Publication Date: 2016-08-17
XIDIAN UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0016] The invention provides a circuit Monte Carlo analysis method based on computer-aided design, aiming to solve the traditional circuit Monte Carlo analysis based on actual circuit simulation, the number of circuit simulations is large, and the simulation cost is high. The circuit is becoming more and more complex, the time cost is unbearable, and the Monte Carlo analysis based entirely on the circuit proxy model is limited by the predictive ability of the proxy model. There are certain errors in the analysis results, and sometimes the error is large, which affects the analysis of the yield of the circuit.

Method used

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  • A method for estimating circuit yield based on cad Monte Carlo analysis
  • A method for estimating circuit yield based on cad Monte Carlo analysis
  • A method for estimating circuit yield based on cad Monte Carlo analysis

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0093] Example 1 Estimation of RF Amplifier Circuit Yield Rate Based on Monte Carlo Analysis

[0094] This example is for a radio frequency amplifier circuit (circuit schematic diagram as figure 2 Shown) to estimate the yield, step 1: determine the circuit design indicators, key component parameters and their distribution:

[0095] The main design indicators of the circuit are shown in Table 1:

[0096] Table 1 Requirements for RF amplifier circuit performance design indicators

[0097] Indicator name

[0098] After the analysis of the circuit principle and the sensitivity analysis of the circuit component parameters, it is determined that the components that have a significant impact on the gain and bandwidth include 5 resistors. The component names, nominal values ​​and standard deviations are shown in Table 2:

[0099] Table 2 Monte Carlo analysis components and their distribution rules of RF amplifier circuit

[0100] Component name

[0101] Under a...

Embodiment 2

[0134] Embodiment 2 Monte Carlo Analysis Example of Bandgap Reference Source Circuit

[0135] In this example, a Monte Carlo analysis is performed on the yield rate of the bandgap reference source. The circuit diagram is as follows Figure 5 As shown, all components in the circuit come from TSMC's 0.5μm CMOS process library. The structure of the test program in this example still uses JMP7.0 of SAS Company, and the circuit simulation software uses HSpiceE-2010.12 of Synopsys Company.

[0136] Step 1: Determine circuit design indicators, key component parameters and their distribution:

[0137] The main design specifications of the circuit are shown in Table 10.

[0138] Table 10 RF amplifier circuit performance index requirements

[0139] Indicator name

Indicator requirements

Voltage Rejection Ratio (PSRR)

[76.5,+∞)

Temperature Coefficient (TC)

[0,152)

[0140] Taking the width W of transistors M1~M8 as the test factor, it can be seen ...

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Abstract

The invention discloses a circuit yield estimation method based on Monte Carlo analysis of computer aided design (CAD). The steps include: determining the topological structure of the analyzed electronic circuit or integrated circuit, the range of performance parameter indicators of the circuit, the parameters of key components and the statistical distribution of component parameters; establishing a proxy model between the circuit performance parameters and the nominal values ​​of component parameters To approximate the circuit; according to the distribution of circuit component parameters, a random sampling combination sequence for circuit Monte Carlo analysis is generated; the proxy model of the circuit performance parameter is used to predict the random sampling combination sequence, and the predicted value of the circuit performance parameter and the prediction of each performance parameter are obtained. The range of the confidence interval of the value; the correction calculation of the predicted value of the circuit performance parameter; the statistical analysis is carried out by substituting the predicted value of the performance parameter into the specification range of the performance parameter index, and the yield rate of the circuit performance parameter is calculated; the time cost of the present invention is low, the number of circuit simulations is small, High analysis efficiency and high accuracy of estimated yield.

Description

technical field [0001] The invention belongs to the technical field of computer-aided design of electronic circuits and integrated circuits, and in particular relates to a circuit yield estimation method based on Monte Carlo analysis of computer-aided design (CAD). Background technique [0002] Due to the manufacturing process and service conditions, the components in any electronic circuit will inevitably be affected by random disturbance factors, so that there will be random errors between the parameters of the components in the actual circuit and the design target values, resulting in The actual value of the component parameter is not necessarily equal to its nominal value, but just a random value within the tolerance range of its nominal value. In the actual electronic circuit design process, the nominal values ​​of component parameters are often used for analysis and design, so there must be differences between the designed circuit and the actual circuit performance. I...

Claims

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Application Information

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Patent Type & AuthorityPatents(China)
IPC IPC(8): G06F17/50
Inventor游海龙贾新章顾铠张潇哲
OwnerXIDIAN UNIV