Solar selective coating normal emissivity test system and test method

Abstract

The invention discloses a test system and a test method for normal emissivity of a solar selective coating. The test system comprises a vacuum heating mechanism, a black body, a temperature control mechanism, a measuring mechanism, a driving mechanism and a computer processing mechanism, wherein the temperature control mechanism controls running of the vacuum heating mechanism and the black body, the driving mechanism drives running of the measuring mechanism, and the measuring mechanism detects energy of a to-be-tested sample and the black body respectively, converts detected energy into a voltage signal and sends the voltage signal to the computer processing mechanism. The test system has the advantages of simpleness, low cost, stable performance and convenient operation, and the test method the advantages of easiness, reliable technology and high test efficiency.

Description

technical field [0001] The invention relates to the technical field of emissivity measurement, in particular to a test system and a test method for the normal emissivity of a solar selective coating. Background technique [0002] The ratio of the spectral radiation intensity in the normal direction of the surface of the heat radiator to the spectral radiation intensity in the normal direction of the black body at the same temperature is called the normal spectral emissivity. If the wavelength λ1-λ2 range is specified for the normal emissivity, it is called the normal band emissivity or the normal integral emissivity. The measurement result of the normal integral emissivity is only one value, so it is convenient to compare the measurement results of different samples and is widely used. [0003] The normal emissivity characterizes the thermal radiation ability of the coating, which is related to the composition of the substance, surface condition, temperature, wavelength of ...

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Problems solved by technology

For example, the energy method measuring normal emissivity device given in the literature Journal of Physics: Conference Series 13 (2005) 63–66 can realize the normal spectral emissivity in the wavelength range of 0.6-25 μm and the temperature range of 60-1500 ° C, but the structure of the Fourier analysis spectrometer is complicated And the cost is expensive, and the technology is difficult to realize

When working, this type of equipment first uses the interferometer to spectroscopically process the radiant energy of the sample, and then measures the spectral emissivity, so the test efficiency is low

[0005] There are very few devices that can be used at low temperatures with a special measurement system. The device provided by the patent CN202794079U can measure the normal emissivity below 90°C. However, after a certain period of use, the device needs to be shut down for cooling. Stability is not ideal

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