Method and device for saving WAT test curve data

A technology of curve data and test data, applied in the field of microelectronics

Inactive Publication Date: 2014-03-19
SHANGHAI HUALI MICROELECTRONICS CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0007] In view of the above existing problems, the present invention discloses a method and device for storing WAT test curve data, so as to overcome the problem of writing data to the same data file in the server when different WAT test machines test the same test program at the same time in the prior art. And it is necessary to manually distinguish the problem of WAT test curve data

Method used

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  • Method and device for saving WAT test curve data
  • Method and device for saving WAT test curve data

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Embodiment Construction

[0039] The present invention will be further described below in conjunction with the accompanying drawings and specific embodiments, but not as a limitation of the present invention.

[0040] The first embodiment of the present invention relates to a method for storing WAT test curve data, which is applied to a WAT ​​test machine, such as figure 1 shown, including the following steps:

[0041] S1, during the WAT test process, temporarily save the obtained test data to the WAT test machine locally.

[0042] S2. After the WAT test is completed, it is judged whether there is curve data in the temporarily saved test data. Judging whether there is curve data is mainly to prevent the formation of empty time stamp data blocks in subsequent steps when there is no curve data in the temporarily saved test data, thus occupying storage space and avoiding redundant operations when subsequent engineers view time stamp data blocks. operation, saving test time.

[0043] S3, when determinin...

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Abstract

The invention discloses a method and a device for saving WAT test curve data. Curve data are saved to locals of WAT testing machines according to time stamps, test data of the WAT testing machines are independent and are not influenced one another, and the situation that different WAT testing machines simultaneously write the data into one data file in a server when testing the same test program and accordingly test curves cannot be distinguished can be effectively prevented; meanwhile the WAT test curve data of each lot are also separated by data block areas with the time stamps, and the curve data can be rapidly and conveniently found from data blocks with the time stamps according to the saving time of the curve data without manual curve data handling and distinguishing.

Description

technical field [0001] The present invention relates to the field of microelectronic technology, in particular to a method and device for saving curve data of a WAT ​​test (Wafer Acceptance Test, wafer acceptance test). Background technique [0002] In WAT testing, it is often necessary to collect electrical curves of many devices. The current common practice is to save the curve data in a public directory on the server, which can be accessed by all WAT testing machines, but this will have the problem of indistinguishable data. [0003] If there are multiple lots (goods) sorted by time to test the same test program, the test data will be written into the data file in order. If you want to separate the test data of each lot, you can only calculate the test curve of each lot. The number of records is then manually separated from the data. If multiple lots test the same test program on different machines, the multiple machines will write data to the data file under the same pa...

Claims

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Application Information

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Patent Type & AuthorityApplications(China)
IPC IPC(8): G06F3/06
Inventor周波莫保章席与凌
OwnerSHANGHAI HUALI MICROELECTRONICS CORP