Test method for touch on cell (TOC)

A touch screen testing and testing method technology, applied in the direction of measuring electricity, measuring devices, measuring electrical variables, etc., can solve the problems of inability to control product anti-interference consistency and product stability, high risk of screen interference, and inability to mass-produce, etc. Achieve the effect of uncomplicated detection process, high detection accuracy and ingenious detection method

Active Publication Date: 2014-08-13
LEAD COMM
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  • Abstract
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  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] However, this technology is still in the stage of research and trial production, and the yield rate is not high enough. Compared with traditional full-fit products, the risk of screen interference is greater
The biggest obstacle in the process of production and debugging is that the touch screen is too close to the display screen, and the interference from the display screen is relatively large, which makes debugging difficult, cannot be mass-produced, and cannot control the consistency of product anti-interference and product quality. stability

Method used

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  • Test method for touch on cell (TOC)
  • Test method for touch on cell (TOC)
  • Test method for touch on cell (TOC)

Examples

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Embodiment Construction

[0014] The invention will be described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the descriptions of the specific embodiments are only used to explain the technical solutions proposed by the present invention, not to limit the present invention.

[0015] Such as Figure 1 to Figure 3 As shown, the test method for the integrated screen of touch and display screen proposed by the present invention, the main steps are:

[0016] Step 1. Screen several standard integration screens.

[0017] It is necessary to select several integrated screens, and then install these integrated screens on the mobile phone for normal use, and check whether the integrated screen produces noise. If there is no noise, it can be used as a standard integrated screen, otherwise it is unqualified. It is better to select more than 25 standard integrated screens, so that a more accurate range of test values ​​can be obtained.

[0018] Step 2...

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Abstract

The invention discloses a test method for a touch on cell (TOC). The test method comprises the steps of screening out a standard integrated screen; performing a noise test on the standard integrated screen to collect test data; performing statistics on the test data, obtaining the maximum range of various indicators of the noise test through the statistics result and taking the maximum range of various indicators as a standard threshold value; performing a noise test on the integrated screen to be tested, comparing the indicators of the noise test with the standard threshold value, judging that the noise test is qualified if the indicators are within the standard threshold value, and otherwise, judging that the noise test is unqualified. The test method for the TOC is high in detection accuracy, convenient to implement, low in implementation cost and capable of promoting popularization of the integrated screen.

Description

technical field [0001] The invention relates to a test device, in particular to a test method for TOC. Background technique [0002] Touch On Cell (abbreviated as TOC) is a new product integrating touch screen and display. The main steps in the process of making TOC screens are to first coat the glass surface on the thin film field effect transistor screen (TFT screen) with indium tin oxide film (ITO film), then etch the touch screen pattern, and then separate the designed module FPC and touch screen FPC Bind it on the glass of TOC, and finally attach the cover plate and install the backlight. It has the advantages of thin thickness, high strength, good reliability, simple structure design, and suitable for standardization. It will become one of the mainstream input and output devices of intelligent terminals in the next 1 to 3 years. [0003] However, at present, this technology is still in the research and trial production stage, and the yield rate is not high enough. Co...

Claims

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Application Information

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IPC IPC(8): G01R31/00
Inventor 杨双辉
Owner LEAD COMM
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