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Test circuit, method and apparatus

A technology for testing circuits and test modes, applied to measuring devices, measuring electricity, measuring electrical variables, etc., can solve problems such as difficulties in engineering test modes

Active Publication Date: 2018-01-19
GUANGDONG OPPO MOBILE TELECOMM CORP LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] However, for some terminal devices without keyboard input, it is very difficult to carry out engineering test mode in the production process

Method used

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  • Test circuit, method and apparatus
  • Test circuit, method and apparatus
  • Test circuit, method and apparatus

Examples

Experimental program
Comparison scheme
Effect test

no. 1 example

[0023] figure 1 It is the test circuit provided by the first embodiment of the present invention, through which the performance test of the terminal equipment can be completed. Such as figure 1 As shown, the test circuit includes: a terminal device 11 with a USB interface 111 and a control unit 112 , and a USB interface wire 12 . The control unit 112 may specifically be an MCU (Micro Control Unit).

[0024] Each pin of the USB interface wire 12 is correspondingly connected with each pin of the USB interface 111 of the terminal device 11; a resistor 13 is connected between the ID pin and the GND pin of the USB interface wire 12; The control unit 112 is connected to each pin of the USB interface 111 of the terminal device 11 , and the ID pin of the USB interface 111 of the terminal device 11 is connected to a power supply. Wherein, the terminal device may be an electronic product without keyboard input, such as a smart camera, a smart speaker, etc., which is not specifically ...

no. 2 example

[0032] figure 2 It is a schematic flow chart of a test method provided in the second embodiment of the present invention, such as figure 2 As shown, it specifically includes the following steps:

[0033] Step 21, the control unit detects the voltage value of the ID pin of the USB interface of the terminal device, and executes step 22.

[0034] For example, according to figure 1 In the shown test circuit, the ID pin of the USB interface 111 of the terminal device 11 is connected with the ID pin of the USB interface wire 12, and a resistor is connected between the ID pin and the GND pin of the USB interface wire 12, so The voltage value of the ID pin of the USB interface of the terminal device is the voltage value generated by the resistor, and the ID pin of the USB interface 111 of the terminal device 11 is connected to the power supply, for example, the voltage value of the power supply is Vcc, wherein, the voltage value of the ID pin of the USB interface of the terminal ...

no. 3 example

[0048] image 3 It is a schematic flow chart of a test method provided by the third embodiment of the present invention, such as image 3 As shown, it specifically includes the following steps:

[0049] Step 31, the control unit detects the voltage value of the ID pin of the USB interface of the terminal device, and executes step 32.

[0050] Step 32, the control unit determines whether the detected voltage value is greater than 0 and less than Vcc.

[0051] For example, Vcc=3.3V, if the control unit determines that the detected voltage value is greater than 0 and less than 3.3V, perform step 33 , otherwise, perform step 36 .

[0052] Step 33, the control unit determines to enter the test mode, and executes step 34.

[0053] Step 34 , the control unit determines the test mode corresponding to the currently detected voltage value according to the preset correspondence between the voltage value and the test mode, and performs step 35 .

[0054] For example, the correspondenc...

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Abstract

The embodiment of the invention discloses a test circuit, method and device. The test circuit includes: a terminal device with a USB interface and a control unit and a USB interface wire; each pin of the USB interface wire is connected to each pin of the USB interface of the terminal device; A resistor is connected between the ID pin and the GND pin; the control unit is connected to each pin of the USB interface of the terminal device, and the ID pin of the USB interface of the terminal device is connected to a power supply. The embodiment of the present invention detects the voltage value of the ID pin of the USB interface of the terminal device in the test circuit, and judges whether to enter the test mode according to the detected voltage value, thereby completing the performance test of the terminal device without keyboard input.

Description

technical field [0001] Embodiments of the present invention relate to terminal equipment testing technology, and in particular to a testing circuit, method and device. Background technique [0002] In the production process of terminal equipment, in order to ensure the quality of terminal equipment, it is necessary to conduct engineering tests on various software and hardware modules of terminal equipment, and this kind of engineering testing is not available to ordinary consumers. Therefore, a good test method is particularly important to facilitate the production of terminal equipment and prevent consumers from entering the test mode when using it. [0003] In existing terminal equipment, for example, for terminal equipment with keyboard input functions such as mobile phones, some engineering test modes can be solidified in the software, and some special numbers or characters can be entered through the keyboard to enter the test mode. [0004] However, for some terminal d...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/00
Inventor 陈延
Owner GUANGDONG OPPO MOBILE TELECOMM CORP LTD