High Precision Inclinometer Based on Oversampling Technology

An over-sampling, high-precision technology, used in measuring devices, measuring inclinations, instruments, etc., can solve problems such as high price, poor seismic performance, and large size

Inactive Publication Date: 2019-02-12
LUOYANG NORMAL UNIV
View PDF2 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

This type of inclinometer has poor seismic performance, large volume and high price

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • High Precision Inclinometer Based on Oversampling Technology
  • High Precision Inclinometer Based on Oversampling Technology
  • High Precision Inclinometer Based on Oversampling Technology

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0015] 1 Level Composition

[0016] The core device of the spirit level is a sensor that can detect the change of gravity with the inclination angle. The measuring instrument adopts the latest differential capacitive three-axis acceleration sensor FXLN8361 of Freescale, and uses analog output. Because the signal output by the sensor inevitably has noise, and the variation range of the level is not within the ideal range for processing by the single-chip microcomputer. Therefore, an integrated operational amplifier is added between the sensor and the microcontroller to process the signal. Using TI's high-performance single-chip MSP430F5529 as the control core, the internal RAM of the single-chip has reached 10KB, which can meet the needs of data cache. The program storage space FLASH reaches 128KB, so that the internal space of the single-chip microcomputer can meet the storage of operation programs. It has multi-channel clock selection register BCM (Basic ClockModule) insid...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention provides a high-precision dip angle measuring instrument based on an over-sampling technology. According to the high-precision dip angle measuring instrument, a microaccelerometer FXLN8361 is adopted as a measurement element, a high-performance low power-consumption single chip microcomputer MSP430F5529 is adopted as a controller, inclination of the measured face is detected through a biaxial measurement method, and constancy of sensitivity of the dip angle is achieved; through an over-sampling algorithm, the measured minimum angle can be improved to 0.05 degree from 0.8 degree.

Description

technical field [0001] The invention relates to an inclination measuring instrument, in particular to a high-precision inclination measuring instrument based on oversampling technology. Background technique [0002] The inclinometer is a device for measuring the inclination angle of the horizontal plane. It is widely used in engineering and technical fields such as astronomical instruments, housing construction, geological surveying, aerospace, medicine, ships, precision automation equipment, robots, and railway bridges. The existing inclinometers can be mainly divided into mechanical, optical and electronic. [0003] Most industries still use the traditional bubble level for measuring angles. Its detection method is to judge whether it is level by combining the position of the blister with operating experience. The bubbles in the liquid are highly unstable and easily disturbed. The judgment of the levelness can only be roughly estimated, and the specific slope cannot be i...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Patents(China)
IPC IPC(8): G01C9/00
CPCG01C9/00
Inventor 陈军周涛王希娟徐万明苗锋
Owner LUOYANG NORMAL UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products