A method for testing the time delay of intelligent terminal equipment switching into nodes in a smart substation

A technology of intelligent terminal equipment and intelligent substation, which is applied in the direction of measuring electricity, measuring devices, and measuring electrical variables, etc., and can solve problems such as missing virtual terminals, incomplete testing, and inaccuracy

Active Publication Date: 2018-09-21
WUHAN NARI LIABILITY OF STATE GRID ELECTRIC POWER RES INST +1
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  • Abstract
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Problems solved by technology

If you want to obtain the precise value of the delay time of the smart terminal's switch-in node, you first need to consult the manual of the smart terminal to find out the mapping relationship between the switch-in node of the smart terminal and the virtual terminal one by one, and then manually select the corresponding switch according to the mapping relationship. The virtual terminal associated with the ingress node, so the test is not only time-consuming and laborious, but also the virtual terminal is often missed due to manual operation, resulting in incomplete and inaccurate testing

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  • A method for testing the time delay of intelligent terminal equipment switching into nodes in a smart substation

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Embodiment Construction

[0027] In order to clearly illustrate the technical features of this solution, the present invention will be described in detail below through specific implementation modes and in conjunction with the accompanying drawings. The following disclosure provides many different embodiments or examples for implementing different structures of the present invention. To simplify the disclosure of the present invention, components and arrangements of specific examples are described below. Furthermore, the present invention may repeat reference numerals and / or letters in different instances. This repetition is for the purpose of simplicity and clarity and does not in itself indicate a relationship between the various embodiments and / or arrangements discussed. It should be noted that components illustrated in the figures are not necessarily drawn to scale. Descriptions of well-known components and processing techniques and processes are omitted herein to avoid unnecessarily limiting the...

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Abstract

Provided is an intelligent terminal equipment opening-inserting node time-delay test method in an intelligent transformer station, comprising the steps of: analyzing an intelligent transformer station SCD file to obtain an intelligent terminal input virtual terminal list; successively traversing the intelligent terminal input virtual terminal list to obtain the mapping relation between opening-inserting nodes and virtual terminals; selecting intelligent terminal equipment to be detected, connecting the opening-inserting nodes to be tested with test equipment, and setting a test time-delay value; performing time-delay test on the opening-inserting nodes; and displaying the mapping relation between opening-inserting nodes and virtual terminals, and the test result of each virtual terminal associated with the opening-inserting nodes to be tested. The method can obtain the association relation between opening-inserting nodes and virtual terminals according to an Inputs definition, test when the association relation between opening-inserting nodes and virtual terminals is unclear, and verify whether the mapping relation in an intelligent terminal is correct according to test results.

Description

technical field [0001] The invention relates to a method for testing the action of intelligent terminal equipment, in particular to a method for testing the time delay of intelligent terminal equipment entering a node in an intelligent substation, and belongs to the technical field of electric power system automation. Background technique [0002] The analysis and measurement of the delay characteristics of the secondary circuit of the smart substation are particularly important for the safe and stable operation and maintenance of the smart substation. The delay of the intelligent terminal entering the node represents the time for the intelligent terminal to receive the protection trip command, which is a very important indicator of the intelligent terminal. The mapping relationship between the input node of the smart terminal and the virtual terminal is preset by the manufacturer when the smart terminal leaves the factory and explained in the manual. The delay test of the ...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/00
CPCG01R31/00
Inventor 周正钦程林梁明辉江翼肖黎张亮
Owner WUHAN NARI LIABILITY OF STATE GRID ELECTRIC POWER RES INST
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