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Method and device for determining working area of fuse unit

A technology of fuse unit and working area, which is applied in special data processing applications, instruments, electrical digital data processing, etc., can solve the problems of long verification cycle, etc., and achieve the effect of solving the long verification cycle and saving the design and verification cycle

Active Publication Date: 2016-10-05
SEMICON MFG INT (SHANGHAI) CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] The main purpose of the present invention is to provide a method and device for determining the working range of the fuse unit, so as to solve the problem in the prior art that a large number of samples are required for testing and the verification period is too long

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  • Method and device for determining working area of fuse unit
  • Method and device for determining working area of fuse unit
  • Method and device for determining working area of fuse unit

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Embodiment Construction

[0029] It should be noted that, in the case of no conflict, the embodiments in the present application and the features in the embodiments can be combined with each other. The present invention will be described in detail below with reference to the accompanying drawings and examples.

[0030] In order to enable those skilled in the art to better understand the solutions of the present invention, the following will clearly and completely describe the technical solutions in the embodiments of the present invention in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only It is an embodiment of a part of the present invention, but not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts shall fall within the protection scope of the present invention.

[0031] It should be noted that the terms "first" and...

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Abstract

The invention discloses a method and device for determining a working area of a fuse unit. The method for determining the working area of the fuse unit comprises the steps as follows: technological parameters of a fuse are determined; working parameters of a drive circuit of the fuse are determined according to the technological parameters, wherein the drive circuit comprises a transistor which is connected with the fuse in series; simulating calculation is carried out through a circuit simulation model on the basis of the working parameters of the drive circuit to obtain a volt-ampere characteristic curve of the transistor; and the working area of the fuse unit is determined according to the technological parameters and the volt-ampere characteristic curve. Through the method and the device disclosed by the invention, the problem of an over-long validation cycle since a lot of samples are needed for an experiment in the prior art is solved.

Description

technical field [0001] The present invention relates to the field of chips, in particular to a method and device for determining the working range of a fuse unit. Background technique [0002] The rupture mode fuse unit (rupture mode efuse element) is widely used in various devices due to the simple design unit, but with the expansion of the function of the fuse unit (simple repair is transformed into a programmable array), the rupture mode fuse The area used by the array is correspondingly larger. At this stage, although the design of experiments (Desigin Of Experiments, referred to as DOE) and simulation principles adopted can roughly define the working range of the fracture mode fuse unit, due to the working characteristics of the fracture mode fuse unit, the design and simulation of the fracture mode fuse The accuracy of the unit is greatly limited due to the influence of factors such as sample number and normal dispersion. [0003] At present, the determination of the...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F17/50
Inventor 张京晶王艳琴
Owner SEMICON MFG INT (SHANGHAI) CORP