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Non-contact space curve precision measurement method and device

A space curve and precision measurement technology, applied in the direction of measuring devices, optical devices, instruments, etc., can solve problems such as large errors, cumbersome measurement operations, and lack of curves

Inactive Publication Date: 2016-11-16
BEIJING JIAOTONG UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] The measurement methods mentioned above still have a major limitation, that is, there is no way to measure the curve. Generally, in daily life, there is indeed a lack of effective methods for curve measurement. Even if there is a method, the measurement operation process is cumbersome and the error is large. , and lacks a dedicated curve measurement tool

Method used

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  • Non-contact space curve precision measurement method and device

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Embodiment Construction

[0042] Embodiments of the present invention are described in detail below, examples of which are shown in the drawings, wherein the same or similar reference numerals designate the same or similar elements or elements having the same or similar functions throughout. The embodiments described below by referring to the figures are exemplary and are intended to explain the present invention and should not be construed as limiting the present invention.

[0043] The non-contact space curve precision measurement method and device according to the embodiment of the present invention will be described below with reference to the accompanying drawings.

[0044] figure 1 It is a flowchart of a non-contact space curve precision measurement method according to an embodiment of the present invention.

[0045] Such as figure 1 As shown, the non-contact space curve precision measurement method of the embodiment of the present invention comprises the following steps:

[0046] S1, determ...

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Abstract

The invention discloses a non-contact space curve precision measurement method and device, wherein the method includes: determining a measurement point; obtaining the distance d from the measurement point to the starting point i of the line to be measured i and the angle information of the i-th point; the initial value of i here is 1; obtain the distance d from the measurement point to the next point i+1 of the line to be measured i+1 and the i+1th point angle information, the point should be very close to the previous point; according to the difference between the i+1th point angle information and the i+1th point angle information to determine the relative rotation angle α i , by the formula Calculate the approximate length from point i to point i+1; repeat the above process, accumulate i while continuously measuring, until the end point of the line to be measured, n is equal to the final value of i continuously accumulated, and then pass l=l 1 +l 2 +…+l n Determine the length of the line to be tested. Through the embodiment of the invention, complete non-contact measurement can be achieved, the measurement can be performed at a place far from the measurement object, and the purpose of measuring the curved surface can be achieved.

Description

technical field [0001] The invention relates to the technical field of length measurement, in particular to a non-contact precision measurement method and device for space curves. Background technique [0002] At present, the main daily measurement methods are mainly ruler-type measurement tools, including rulers, tapes and tapes for daily use. Such measurement tools are contact measurements, that is, they must be able to touch the measurement object, and the ruler must be aligned with the measurement object. for the purpose of measurement. The limitation of this type of tool is mainly the contact. It must be able to touch the measurement object, and the measurement cannot be completed for the measurement object that is difficult to reach. In addition, and in some cases, because the measurement object is too long, a single person cannot perform the measurement operation. The above are the most commonly used measurement methods. [0003] Another commonly used measurement me...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/02
CPCG01B11/026
Inventor 李虹项鹏飞田雨丰苏美帆
Owner BEIJING JIAOTONG UNIV
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