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A mt29f series nand FLASH test burn-in system with a customizable process

A process and burn-in technology, applied in the field of MT29F series NANDFLASH test burn-in system, can solve the problems of lack of versatility, high cost overhead, limitation of burn-in signal transmission frequency, etc., to solve the problems of lack of versatility and low frequency Effect

Active Publication Date: 2020-02-14
CHINA ACADEMY OF SPACE TECHNOLOGY
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] (2) The same test ability is limited
Taking the 128Gbit model product with 36 signal pins in the MT29F series as an example, an ATE equipped with 256 test channels can only test 7 devices at the same time, and hardware expansion will bring huge costs
[0007] (3) Insufficient versatility
[0008] Existing burn-in systems for NAND FLASH are usually dedicated systems, that is, burn-in tests can only be performed on a specific type of NAND FLASH device
[0009] (4) Insufficient effectiveness of aging
The advantage of this architecture is that it effectively reduces the number of burn-in signals, but the disadvantage is that it limits the transmission frequency of burn-in signals and reduces the effectiveness of dynamic burn-in tests (failure to keep all devices in working condition all the time)

Method used

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  • A mt29f series nand FLASH test burn-in system with a customizable process
  • A mt29f series nand FLASH test burn-in system with a customizable process
  • A mt29f series nand FLASH test burn-in system with a customizable process

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Embodiment Construction

[0032] Aiming at the deficiencies of the prior art, the present invention proposes a MT29F series NAND FLASH test burn-in system with a customizable process, which can carry out "functional test, dynamic burn-in, static burn-in, steady-state life, erasing life" for MT29F series NAND FLASH The specific performance indicators include: with 64 test stations, 64 NAND FLASH can be tested at the same time, and a device with a specified number can also be operated independently; for the specified NAND FLASH Erase / write / read operations of the entire storage area can be performed, or a block or page of the device can be operated independently. The system of the present invention adopts the design method of separating instructions from actual function modules, and realizes the modular design of various functional operations of NAND FLASH on the lower computer. The upper computer sends operation instructions according to the specified test process, and tests by setting different instructi...

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Abstract

An MT29F series NAND FLASH test aging system with a customizable process comprises an upper computer, a program control power source, a high temperature test box, a USB-to-UART bridge, and a lower computer. The lower computer comprises N motherboards with a same structure, M signal boards with a same structure, and K DUT boards with a same structure. Multiple signal boards are mounted on each motherboard in the lower computer, and one DUT board is mounted on each signal board. The motherboard comprises a power source interface, a UART interface, multiple connectors docking with the signal board, and multiple signal board identity setting circuit docking with the signal board. The signal board comprises an FPGA used as a test controller and an auxiliary circuit thereof, and also comprises a connector docking with the motherboard and a connector docking with the DUT board. The DUT board comprises multiple high-temperature resistant test clippers and a connector docking with the signal board.

Description

technical field [0001] The invention relates to an MT29F series NAND FLASH test burn-in system with a process that can be customized. Background technique [0002] Micron's MT29F series NAND FLASH adopts SLC architecture design and is compatible with ONFI interface. The single-chip capacity ranges from 32Gbit to 256Gbit, and the quality grades include commercial and industrial grades. A series of reliability screening and assessment tests are required before low-grade NAND FLASH is used in aerospace models. The tests related to the electrical characteristics of the device mainly include: functional test, dynamic burn-in, static burn-in, steady-state life, erasing life and data retention etc. Although the conditions of each test are different, from the bottom layer, they all perform basic operations on NAND FLASH, such as erasing / writing / reading. The existing NAND FLASH testing aging system has the following problems: [0003] (1) Single function [0004] Various electric...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G11C29/56
CPCG11C29/56G11C2029/5606
Inventor 王贺张大宇宁永成张松蒋承志王熙庆杨彦朝杨发明
Owner CHINA ACADEMY OF SPACE TECHNOLOGY
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