A mt29f series nand FLASH test burn-in system with a customizable process
A process and burn-in technology, applied in the field of MT29F series NANDFLASH test burn-in system, can solve the problems of lack of versatility, high cost overhead, limitation of burn-in signal transmission frequency, etc., to solve the problems of lack of versatility and low frequency Effect
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[0032] Aiming at the deficiencies of the prior art, the present invention proposes a MT29F series NAND FLASH test burn-in system with a customizable process, which can carry out "functional test, dynamic burn-in, static burn-in, steady-state life, erasing life" for MT29F series NAND FLASH The specific performance indicators include: with 64 test stations, 64 NAND FLASH can be tested at the same time, and a device with a specified number can also be operated independently; for the specified NAND FLASH Erase / write / read operations of the entire storage area can be performed, or a block or page of the device can be operated independently. The system of the present invention adopts the design method of separating instructions from actual function modules, and realizes the modular design of various functional operations of NAND FLASH on the lower computer. The upper computer sends operation instructions according to the specified test process, and tests by setting different instructi...
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