Optoelectronic measuring device

A technology of photoelectric measurement and measurement devices, applied in the direction of measurement devices, active optical measurement devices, radio wave measurement systems, etc., can solve the problems of inaccurate measurement and insufficient measurement, and achieve the goal of reducing demand and high acceptable measurement radiation power Effect

Active Publication Date: 2017-05-10
HEXAGON TECH CENT GMBH
View PDF15 Cites 8 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In this case, the pulse detection and the signal-to-noise ratio are correspondingly improved, although long distances and / or objects at great distances are not measurable or can only be measured insufficiently or imprecisely

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Optoelectronic measuring device
  • Optoelectronic measuring device
  • Optoelectronic measuring device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0053] figure 1 Shows the solar global radiation incident on the Earth (at sea level) according to wavelength. The total radiation has a maximum in the visible range of the radiation spectrum and falls towards the near-infrared range. That is to say that for outdoor measurements the measurement radiation with wavelengths in the near infrared range from a wavelength of about 1150 nm is at least three times smaller than at 550 nm. In addition, the atmospheric window with high light transmission is located between 1150nm and 1350nm. According to the invention, radiation sources in this spectral range are more advantageous than measuring radiation in the visible range, for example, using the known wavelengths 532nm, 635nm, but also the range adjacent to the IR spectrum, for example, 1064nm, because in this range , the interfering influence of natural external radiation and / or background radiation is significantly smaller. In particular, the total radiation is particularly low ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

An optoelectronic measuring device (1) for distance and / or position determination comprising radiation sources (35, 40, 75, 310) for generating optical measurement radiation (30, 36) of a first wavelength, wherein the measurement radiation (30, 36) is emitted in an oriented manner into free space. The radiation sources (35, 40, 75, 310) are designed such that the first wavelength is in the range between 1210 nm and 1400 nm and the power of the emitted measurement radiation (30, 36) is at least 14 mW in the chronological and spatial average.

Description

technical field [0001] The invention relates to an optoelectronic measuring device according to the preamble of claim 1 and an optoelectronic measuring method according to the preamble of claim 12 . Background technique [0002] Various forms of optoelectronic measuring devices are known, with which to determine distance and / or position based on optical radiation. Examples are geodetic devices such as electronic tachymeters, total stations, multistations, or laser scanners for geodetic or industrial surveying purposes, laser trackers, or hand-held electronic rangefinders or direction finders. These devices share the feature that they comprise at least one radiation source for generating measuring radiation and optical means such as lenses, optical fibers or collimators, by means of which the generated measuring radiation can be directed towards the object to be measured are emitted into free space, for this reason these devices are also referred to as so-called free beam se...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): G01S17/32
CPCG01S17/32G01C3/08G01C15/002G01S17/42G01S17/66G01S17/08G01S7/4802G01S7/4814G01S7/4812
Inventor J·辛德林
Owner HEXAGON TECH CENT GMBH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products