An electron bombardment ionization source

An electron bombardment ionization and ionization chamber technology, applied in the field of mass spectrometers, can solve the problems of large size and not suitable for small portable mass spectrometers, etc., and achieve the effects of small size, simple and reliable arrangement, and reduction of the use of cables

Active Publication Date: 2019-03-05
NAT INST OF METROLOGY CHINA
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Problems solved by technology

[0006] However, current electron impact ionization (EI) sources are generally bulky and not suitable for small portable mass spectrometers

Method used

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  • An electron bombardment ionization source
  • An electron bombardment ionization source
  • An electron bombardment ionization source

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Embodiment Construction

[0040] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments It is a part of embodiments of the present invention, but not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention.

[0041] An embodiment of the present invention provides an electron bombardment ionization source, see Figure 4 , the electron bombardment ionization source provided by the embodiment of the present invention includes: a feed-through flange assembly 401 and an electron bombardment ionization source assembly 402;

[0042] see Figure 5a with Fi...

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Abstract

The invention provides an electron impact ionization source comprising a feedthrough flange assembly and an electron impact ionization source assembly. The feedthrough flange assembly comprises a standard flange and a plurality of feedthrough electrodes. The standard flange is provided with a plurality of threaded holes for fixing the electron impact ionization source assembly. Each feedthrough electrode is a cylindrical metal bar and passes through the standard flange axially. The feedthrough electrodes on the feedthrough flange assembly correspond to lead electrode outgoing lines of the electron impact ionization source assembly one to one and are electrically connected in a direct insertion way. The electron impact ionization source assembly includes an ion source base, an ionization chamber, two lamp filament parts, a repelling electrode, a lens group, a heater, a temperature sensor, a temperature controller and a pair of magnets. The electron bombardment ionization source is small in size and enriched in function, and can be easily integrated into a portable mass spectrometer.

Description

technical field [0001] The invention relates to the technical field of mass spectrometers, in particular to an electron bombardment ionization source. Background technique [0002] Mass spectrometer is one of the most basic instruments for studying the basic composition, structural characteristics, physical and chemical properties of substances. It is an essential instrument in the fields of life science, material science, food safety, environmental protection, etc., and is the core of modern analytical instruments. It is essentially a spectroscopic method that uses electric and / or magnetic fields to separate moving ions according to their mass-to-charge ratios and then detect them. By measuring the exact mass of the ion, the compound composition of the ion can be determined. It is mainly used for structural identification of compounds, and it can provide structural information such as molecular weight, elemental composition, and functional groups of compounds. It has a wi...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01J49/02H01J49/14H01J49/26
CPCH01J49/022H01J49/147H01J49/26
Inventor 黄泽建方向江游熊行创
Owner NAT INST OF METROLOGY CHINA
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